Metrological management of the high dc resistance scale at INRIM

Galliana, Flavio; Capra, Pier Paolo; Gasparotto, E.

doi:10.1016/j.measurement.2008.07.002

Cited by 21 publications

(13 citation statements)

References 15 publications

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“…A 10 kX thermistor in the case allows the measurement of the temperature. The temperature coefficients of the 100 MX resistors of the Hamon were determined by means of the DMM-DcVC based method [5] and were: a 23 ffi 3.3 Â 10 À6 /°C and b ffi 5.4 Â 10 À7 /°C 2 , while the voltage coefficient of the 0263-2241/$ -see front matter Ó 2010 Elsevier Ltd. All rights reserved. doi:10.1016/j.measurement.2010.07.006 series of the resistors evaluated with the same method was negligible (ffi 1 Â 10 À8 /V).…”

Section: The 10 â 100 MX Hamon Resistormentioning

confidence: 99%

Hamon 10×100MΩ resistor based traceable source for calibration of picoammeters in the range 100pA–100nA

Galliana

Capra

2010

Measurement

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Section: The 10 â 100 MX Hamon Resistormentioning

confidence: 99%

Hamon 10×100MΩ resistor based traceable source for calibration of picoammeters in the range 100pA–100nA

Galliana

Capra

2010

Measurement

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“…However, the main difficulty in measuring mainly resistive impedance comes when high accuracy and wide range is required, i.e., a single device able to satisfy different uses. Recently, some works have provided different ranges: 0.1 mΩ to 10 Ω [16], 100 kΩ to 100 MΩ [17,18] and 10 kΩ to 1 TΩ [19]. In all cases, they used complex laboratory setups with specific commercial instruments.…”

Section: Introductionmentioning

confidence: 99%

Novel Resistance Measurement Method: Analysis of Accuracy and Thermal Dependence with Applications in Fiber Materials

Casans

Muñoz

Iakymchuk

2016

Sensors

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Material resistance is important since different physicochemical properties can be extracted from it. This work describes a novel resistance measurement method valid for a wide range of resistance values up to 100 GΩ at a low powered, small sized, digitally controlled and wireless communicated device. The analog and digital circuits of the design are described, analysing the main error sources affecting the accuracy. Accuracy and extended uncertainty are obtained for a pattern decade box, showing a maximum of 1% accuracy for temperatures below 30 ∘C in the range from 1 MΩ to 100 GΩ. Thermal analysis showed stability up to 50 ∘C for values below 10 GΩ and systematic deviations for higher values. Power supply Vi applied to the measurement probes is also analysed, showing no differences in case of the pattern decade box, except for resistance values above 10 GΩ and temperatures above 35 ∘C. To evaluate the circuit behaviour under fiber materials, an 11-day drying process in timber from four species (Oregon pine-Pseudotsuga menziesii, cedar-Cedrus atlantica, ash-Fraxinus excelsior, chestnut-Castanea sativa) was monitored. Results show that the circuit, as expected, provides different resistance values (they need individual conversion curves) for different species and the same ambient conditions. Additionally, it was found that, contrary to the decade box analysis, Vi affects the resistance value due to material properties. In summary, the proposed circuit is able to accurately measure material resistance that can be further related to material properties.

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“…A successive transfer of the unit to the standards with higher values, up to 10 k , can be performed with the same CCC. nominal values differing by 10 times and 100 times can be performed with the use of high resistance Hamon transfer devices (Hamon network) [3]- [7]. During CPEM 2010, the authors introduced an idea of a system for resistance scaling from 10 k to 100 T , based on Hamon transfer devices [7].…”

Section: Introductionmentioning

confidence: 99%

“…nominal values differing by 10 times and 100 times can be performed with the use of high resistance Hamon transfer devices (Hamon network) [3]- [7]. During CPEM 2010, the authors introduced an idea of a system for resistance scaling from 10 k to 100 T , based on Hamon transfer devices [7]. This system was imperfect due to the lack of thermal stability of resistance standards and faults in the Hamon transfer devices [2].…”

Section: Introductionmentioning

confidence: 99%

Resistance Scaling From 10 ${\rm k}\Omega$ Up to 100 ${\rm T}\Omega$ With New Designs of Hamon Transfer Devices

Lisowski

Krawczyk

2013

IEEE Trans. Instrum. Meas.

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This paper describes the realization of a new system for resistance scaling from 10 k to 100 T . The resistance unit has been transferred from the quantum hall resistance (QHR) primary resistance standard to the resistance standard with a nominal value of 10 k by a cryogenic current comparator. For further transfer of the resistance unit from 10 k to 100 T , Hamon transfer devices (Hamon networks) are used. For its complete realization five devices have been developed: 10-100-1000 k , 1-10-100 M , 0.1-1-10 G , 10-100-1000 G , and 1-10-100 T . The first two devices have a single insulation, and the next three have a double isolation. In the transfer devices with the double insulation, triax-type connectors are used. All transfer devices have individual temperature stabilization within ±0.01°C. In the paper, the factors influencing device accuracy have been described. The insulation leakage is recognized, and the error caused by it is calculated. The guarding network for the new design of Hamon transfer devices is presented. Voltage coefficients of resistance and settling times of resistors used in these devices have been determined and discussed. Uncertainties for the Hamon transfer devices ratios have been calculated. Calibration results have been presented. The developed system is currently tested in the Central Office of Measures in Poland.

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Metrological management of the high dc resistance scale at INRIM

Cited by 21 publications

References 15 publications

Hamon 10×100MΩ resistor based traceable source for calibration of picoammeters in the range 100pA–100nA

Hamon 10×100MΩ resistor based traceable source for calibration of picoammeters in the range 100pA–100nA

Novel Resistance Measurement Method: Analysis of Accuracy and Thermal Dependence with Applications in Fiber Materials

Resistance Scaling From 10 ${\rm k}\Omega$ Up to 100 ${\rm T}\Omega$ With New Designs of Hamon Transfer Devices

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