2004
DOI: 10.1016/j.jmmm.2003.12.1037
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MFM analysis of magnetization process in CoPt dot-array

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Cited by 11 publications
(4 citation statements)
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“…The shifts of the tips under the magnetization of the sample are represented on MFM images by dark and bright regions, e.g. the dark regions demonstrate large negative shifts (repulsion) and the bright regions demonstrate large positive shifts (attraction) [18]. The magnetic dispersity of the Fe oxide layer was more homogenous than that of the Au-Fe oxide layer, indicating that the size distribution of Fe oxide nanoparticles is more homogenous.…”
Section: Magnetic Analysis By Mfmmentioning
confidence: 99%
“…The shifts of the tips under the magnetization of the sample are represented on MFM images by dark and bright regions, e.g. the dark regions demonstrate large negative shifts (repulsion) and the bright regions demonstrate large positive shifts (attraction) [18]. The magnetic dispersity of the Fe oxide layer was more homogenous than that of the Au-Fe oxide layer, indicating that the size distribution of Fe oxide nanoparticles is more homogenous.…”
Section: Magnetic Analysis By Mfmmentioning
confidence: 99%
“…[1][2][3][4][5][6][7] In this connection considerable efforts have been applied to the investigation of coercivity, thermal stability, and recording properties of patterned systems. [8][9][10][11][12][13][14][15][16] However most studies focused on the investigation of the array's averaged properties and inhomogeneous dot's switching in an external homogeneous magnetic field. In this article we discuss the peculiarities of the magnetization reversal of individual dots in a nonhomogeneous magnetic field.…”
Section: Introductionmentioning
confidence: 99%
“…For the fabrication of bit patterned media, lithographic patterning, ion irradiation, and various chemical methods have been reported so far. [14][15][16][17][18][19][20] In the lithographic patterning and the self-organizing methods, removing materials between dots or assembling particles leads to not only variations in the height of the surface, which causes tribology problems in the near-contact recording scheme but also damages dots which leads to variations in the reversal field.…”
Section: Introductionmentioning
confidence: 99%