The use of gold-coated multi-walled carbon nanotube (Au/MWCNT) bilayer composite surfaces has been discussed in previous work as a method for improving the reliability of switch contacts [1,2]. A consequence of large lifetimes means that testing to failure is time consuming. To address this we developed a MEMS-based test platform which enables testing at high frequency [3]. The MEMS devices were developed in a two stage process. In this paper the results obtained from the first stage design for a MEMS-based test platform device are discussed. Further to this, an overview of the design of the second stage device is given. Using the first-stage device, at a current of 50 mA (at 4 V), the composite yielded a lifetime in excess of 44 million hot-switching cycles [4]. At a lower load current of 10 mA, the contact maintained a stable contact for >500 million hot-switching cycles. As well as monitoring the contact resistance, SEM images of the surface before and after testing are presented. The first stage MEMS-based developmental device is a step towards a smaller integrated and packaged high-lifetime metal-contacting MEMS switch. An overview of the considerations for the redesign is given with a discussion on the predicted performance and improvement for accelerated switch testing.
IntroductionThe advantages of MEMS relay switches over PIN diode and FET devices are well known; most notably lower onresistance, higher isolation and cut-off frequency [5][6][7][8]. MEMS relays have very high values of off-resistance, which is important for low power applications, especially where power consumption is of concern [9]. There are two common implementations of MEMS switches: capacitively coupled and metal-contacting. The use of capacitive switches at low frequencies is limited, however they tend to be capable of surviving high numbers (>500,000,000) of switching cycles without showing any signs of mechanical failure [10]. For the second implementation, metal-contacting switches, the electrical contacts are mechanically brought into contact; there is no dielectric layer present on the contacts which means that the transmission of DC to high frequency signals is possible. Due to the mechanical switch opening and closing process the contact surfaces suffer degradation which over consecutive opening and closing processes, causes the switch to fail [2]. In this paper we discuss hot-switching tests (4V, 10 mA and 50 mA) performed on the MEMS-based platform in which an electrostatically actuated micro-machined gold-coated silicon cantilever beam repeatedly makes contact with an Au/MWCNT composite.