Microscopic surface photovoltage spectroscopy

Saraf, Shimon; Shikler, Rafi; Yang, Jun; Rosenwaks, Y.

doi:10.1063/1.1468275

Cited by 16 publications

(7 citation statements)

References 13 publications

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“…Shifts of the surface potential (Fig. 3) are attributed to generation and/or redistribution of free charge carriers 10, 13–15. Similar KFM studies on polypyrrole‐diamond heterojunction showed very fast (<1 s) charge carrier generation and recombination.…”

Section: Discussionsupporting

confidence: 57%

Optoelectronic performance of poly(p‐phenylenevinylene)‐based heterostructures evaluated by scanning probe techniques

Čermák

Rezek

Cimrová

et al. 2009

Physica Status Solidi (b)

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Thin polymer blend films made of donor and acceptor poly(p‐phenylenevinylene) (PPV)‐based polymers were prepared. Diverse scanning probe techniques (atomic force microscopy (AFM), Kelvin force microscopy (KFM), current‐sensing AFM (CS‐AFM), and micro‐Raman mapping) are used to characterize morphologic, electronic as well as optoelectronic properties of the heterostructures. Morphologies of the heterostructures are correlated with microscopic and macroscopic electronic response to a broad‐band visible illumination. The data are discussed with respect to photovoltaic applications.

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Section: Discussionsupporting

confidence: 57%

Optoelectronic performance of poly(p‐phenylenevinylene)‐based heterostructures evaluated by scanning probe techniques

Čermák

Rezek

Cimrová

et al. 2009

Physica Status Solidi (b)

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“…Additionally, although KPFM studies highlighted in this review show light‐induced changes in CPD, there is no study examining this change as a function of wavelength of the incident radiation. This type of study has been done on the GaP p–n junction, but is lacking for photovoltaic materials. For OHPs, comparing this type of data with external quantum efficiency measurements of the device will provide a more detailed picture of how morphology variations in the OHP thin film are affecting its optoelectronic properties and, ultimately, solar cell PCE.…”

Section: Discussionmentioning

confidence: 99%

Scanning Probe Microscopy Applied to Organic–Inorganic Halide Perovskite Materials and Solar Cells

et al. 2017

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preparation can lead to a large variety of film morphologies.OHPs have impressive optoelectronic properties, ranging from high absorption coefficient and suitable bandgap for visible light, [5] low exciton binding energy, [6,7] high carrier mobility, and long carrier diffusion lengths, [8] all of which make this class of materials especially suitable for PV applications. It is of the utmost importance to understand the effect that film morphology has on these critical properties, and subsequently on standard solar cell device parameters such as photocurrent, photovoltage, and PCE. OHP devices are also known to degrade under prolonged exposure to environmental factors including moisture, iodine vapor, high temperature, and sunlight. [9][10][11][12] Understanding how and why the film morphology and performance changes over time is also of key interest.Perovskite films are often characterized using conventional techniques such as X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), quantum efficiency measurements, and I-V curve measurements, which lack high spatial resolution. However, scanning probe microscopy (SPM) techniques offer a unique advantage to correlate changes in optoelectronic properties and PV performance parameters with morphological features on the nanoscale. SPM techniques have been employed to characterize other PV technologies such as silicon, copper indium gallium selenide (CIGS), CdTe, GaAs, and organic solar cells. [13][14][15][16][17][18][19][20][21][22] Open-circuit voltage variation due to grain orientation and grain boundaries was revealed. [13] Moreover, SPM has been used to investigate the interfacial properties in polycrystalline Si [14] as well as in blended [15] and phase-segregated [16] organic solar cells. Furthermore, scanning-probe techniques demonstrated their ability to study molecules used for dye sensitized solar cells down to the atomic level. [20,21] In addition, SPM techniques can provide insight into phenomenon specific to OHPs. This includes film growth variation depending on fabrication technique, film degradation due to environmental factors, and undesirable current-voltage hysteresis possibly induced by ion migration within the OHP film. A wide variety of SPM techniques have been used to explore heterogeneities in OHP thin film properties (Figure 1a-c), including topographic atomic force micro scopy (AFM), Kelvin probe force microscopy (KPFM), scanning tunneling microscopy (STM), conductive-AFM (c-AFM), and scanning near-field optical microscopy (SNOM).To meet the increasing energy demands of the growing society, environmentally friendly and renewable energy sources are needed. Organicinorganic halide perovskites are a promising class of materials for building solar cells due to their easy fabrication, flexibility, and bandgap tunability. The highest efficiency achieved with these materials in the lab is comparable to conventional silicon solar cells currently on the market. However, their commercialization is hampered by certain challenges, such as stabil...

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“…Photovoltage measurements on the cross section using KPFM techniques have also been conducted on various types of solar cells such as III–V multi-junctions [ 9 ] or CuIn x Ga (1 − x ) Se 2 (CIGS) heterojunctions [ 10 ] revealing photogeneration effects and local surface potential shifts with the illumination intensity. The influence of the wavelength of illuminating light has also been reported [ 11 ]. More recently, it has been shown that nanoscale photovoltage measurements using a pulsed light source enable to extract the photocarrier lifetime [ 12 ].…”

Section: Introductionmentioning

confidence: 99%

Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination

Narchi¹,

Alvarez²,

Chrétien³

et al. 2016

Nanoscale Res Lett

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Both surface photovoltage and photocurrent enable to assess the effect of visible light illumination on the electrical behavior of a solar cell. We report on photovoltage and photocurrent measurements with nanometer scale resolution performed on the cross section of an epitaxial crystalline silicon solar cell, using respectively Kelvin probe force microscopy and conducting probe atomic force microscopy. Even though two different setups are used, the scans were performed on locations within 100-μm distance in order to compare data from the same area and provide a consistent interpretation. In both measurements, modifications under illumination are observed in accordance with the theory of PIN junctions. Moreover, an unintentional doping during the deposition of the epitaxial silicon intrinsic layer in the solar cell is suggested from the comparison between photovoltage and photocurrent measurements.

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Microscopic surface photovoltage spectroscopy

Cited by 16 publications

References 13 publications

Optoelectronic performance of poly(p‐phenylenevinylene)‐based heterostructures evaluated by scanning probe techniques

Optoelectronic performance of poly(p‐phenylenevinylene)‐based heterostructures evaluated by scanning probe techniques

Scanning Probe Microscopy Applied to Organic–Inorganic Halide Perovskite Materials and Solar Cells

Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination

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