2006
DOI: 10.1016/j.vacuum.2006.05.011
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Microtrench depth and width of SiON plasma etching

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Cited by 3 publications
(3 citation statements)
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“…As shown in Figure 9c, the etching rates of the microtrench increased from 3 nm/min to 5 nm/min in the Y direction and from 9 nm/min to 13 nm/min in the X direction when the ICP power increased from 360 W to 450 W. Then, the etching rates rocketed to 16 nm/min in the Y direction and 25 nm/min in the X direction at 540 W ICP power. The reason for this is that the sidewall profile becomes bowed at high ICP power when Cl 2 is used as the etching gas, then the bowed sidewall profile leads to the accumulation of ions at the corner of the mesa bottom, causing an increase in the microtrench etching rate [32]. nm/min to 13 nm/min in the X direction when the ICP power increased from 360 W to 450 W. Then, the etching rates rocketed to 16 nm/min in the Y direction and 25 nm/min in the X direction at 540 W ICP power.…”
Section: Resultsmentioning
confidence: 99%
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“…As shown in Figure 9c, the etching rates of the microtrench increased from 3 nm/min to 5 nm/min in the Y direction and from 9 nm/min to 13 nm/min in the X direction when the ICP power increased from 360 W to 450 W. Then, the etching rates rocketed to 16 nm/min in the Y direction and 25 nm/min in the X direction at 540 W ICP power. The reason for this is that the sidewall profile becomes bowed at high ICP power when Cl 2 is used as the etching gas, then the bowed sidewall profile leads to the accumulation of ions at the corner of the mesa bottom, causing an increase in the microtrench etching rate [32]. nm/min to 13 nm/min in the X direction when the ICP power increased from 360 W to 450 W. Then, the etching rates rocketed to 16 nm/min in the Y direction and 25 nm/min in the X direction at 540 W ICP power.…”
Section: Resultsmentioning
confidence: 99%
“…nm/min to 13 nm/min in the X direction when the ICP power increased from 360 W to 450 W. Then, the etching rates rocketed to 16 nm/min in the Y direction and 25 nm/min in the X direction at 540 W ICP power. The reason for this is that the sidewall profile becomes bowed at high ICP power when Cl2 is used as the etching gas, then the bowed sidewall profile leads to the accumulation of ions at the corner of the mesa bottom, causing an increase in the microtrench etching rate [32]. BCl3 as an additive in the etching gas can increase the etching rate of GaN [33].…”
Section: Resultsmentioning
confidence: 99%
“…[47]. We attribute this phenomenon to the formation of charged polymer SiF x O y after the increase of the oxygen ratio [49] , which attracts ions near the sidewall, increasing the rate of chemical reactions near the sidewall. These microtrenches, although no direct comparison has been made, may increase the scattering loss of the waveguide.…”
Section: (G)mentioning
confidence: 91%