1991
DOI: 10.1007/978-1-4615-3970-4
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Microwave Semiconductor Devices

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Cited by 64 publications
(15 citation statements)
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“…Energy difference between Γ and L valleys in GaAs ∆E ΓL = 0.31 eV [37] Effective masses m * n = 0.067m e ; m * p = 0.082m e [49] Intrinsic carrier concentration [48] where N c = 2…”
Section: Simulation Results and Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Energy difference between Γ and L valleys in GaAs ∆E ΓL = 0.31 eV [37] Effective masses m * n = 0.067m e ; m * p = 0.082m e [49] Intrinsic carrier concentration [48] where N c = 2…”
Section: Simulation Results and Discussionmentioning
confidence: 99%
“…∆E is the energy difference between the valleys; r is the ratio between state density in the upper valley and the lower one calculated utilizing the following equation [37]:…”
Section: Models and Simulation Methodsmentioning
confidence: 99%
“…Higher resistance CNTs have lower values for S I , roughly in inverse proportion to the resistance, and therefore have about the same S V . Using standard small-signal microwave detector theory 19 we can calculate the current responsivity from the following expression:…”
mentioning
confidence: 99%
“…The basic idea, that of applying bulk-type effects, was of course quite old, but this is not unusual if one examines recent technological history. To mention one single example, the hetero-junction bipolar transistor was discussed as early as the 1950s, but was not realizable until the mid 1980s (see Yngvesson, 1991).…”
Section: A Practical Hot Electron Mixermentioning
confidence: 98%
“…The sequence of layers grown in the same as is used for AIGaAs/GaAs Heterojunction Field Effect Transistors (HFETs) (Zimmerman & Salmer, 1990;Yngvesson, 1991). The device is contained within a mesa, which is surrounded by semiinsulating GaAs for isolation.…”
Section: Deg Device Configuration and Test Setupmentioning
confidence: 99%