2003
DOI: 10.1016/s0038-1101(02)00445-8
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Minority carrier lifetime and diffusion length in Si1−x−yGexCy heterolayers

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Cited by 11 publications
(7 citation statements)
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“…Carrier lifetime is a useful index of the quality of heterostructures because any defects produced by interlattice strains caused by mismatching of layers change the lifetime [172][173][174][175][176][177]. So the degree of deterioration is readily evident from the lifetime measurements.…”
Section: Analysis Of the Effect Of Carbon Content In Lattice Matched mentioning
confidence: 99%
“…Carrier lifetime is a useful index of the quality of heterostructures because any defects produced by interlattice strains caused by mismatching of layers change the lifetime [172][173][174][175][176][177]. So the degree of deterioration is readily evident from the lifetime measurements.…”
Section: Analysis Of the Effect Of Carbon Content In Lattice Matched mentioning
confidence: 99%
“…Since the diffusion length is directly proportional to the carrier lifetime we can conclude that improvement in lifetime of the carriers results in improved electrical performance of solar cells [11][12][13]. With increase in diffusion length in a device the generation life time increases as per the relation, L d ¼ ½lð kT q Þt g 1=2 [14], where, L d is the diffusion length and t g is the generation lifetime. Thus, an increase of generation life time causes the enhancement of efficiency of the solar cell from 13.7% for the non-DRE cells to 15.1% for the DRE cells.…”
Section: Resultsmentioning
confidence: 99%
“…The carrier lifetime of the passivation layer deposited with a 100-W Si target power was 8.9 μs. Samnanta et al reported that impurity in the semiconductor can degrade the lifetime by the creation of an electrical defect center or crystal imperfection [14]. Therefore, a carbon-rich thin layer can have more microdefects than a Si-rich film.…”
Section: Resultsmentioning
confidence: 99%