We demonstrate the electrical detection of pulsed X-band Electron Nuclear Double Resonance (ENDOR) in phosphorus-doped silicon at 5 K. A pulse sequence analogous to Davies ENDOR in conventional electron spin resonance is used to measure the nuclear spin transition frequencies of the 31 P nuclear spins, where the 31 P electron spins are detected electrically via spin-dependent transitions through Si/SiO2 interface states, thus not relying on a polarization of the electron spin system. In addition, the electrical detection of coherent nuclear spin oscillations is shown, demonstrating the feasibility to electrically read out the spin states of possible nuclear spin qubits.Control and readout of electron spin states in solids are well established down to the single spin level [1,2]. In contrast, the readout of nuclear spin states has mostly been limited to optical techniques [3,4]. However, for nanostructures not exhibiting luminescence, an electrical readout scheme is required. Electrical detection of nuclear magnetic resonance has been performed on e.g. two-dimensional electron gases, identifying the origin of the Overhauser field [5], and the electrical readout of nuclear spin states has been achieved for this system [6]. In phosphorus-doped silicon, McCamey et al. [7] have recently demonstrated the electrical readout of nuclear spins at 8.6 T. While both these studies employ highly polarized spin systems for the readout, we make use of a spin-dependent recombination process via Si/SiO 2 interface states [8]; this approach does not rely on a polarization of the electron spin system and thus works under experimental conditions where the thermal energy is much larger than the electron Zeeman splitting [9]. We here demonstrate the electrical detection of coherent nuclear spin oscillations in phosphorus-doped silicon using pulsed Electrically Detected Electron Nuclear Double Resonance (EDENDOR) at 0.3 T using X-band frequencies (10 GHz). Outside the framework of quantum computation, pulsed EDENDOR could become a valuable spectroscopic tool for the characterization of point defects in semiconductors combining the high sensitivity of continuous-wave EDENDOR [10] with the reduction of the dynamic complexity of the coupled electron and nuclear spin systems via pulsed spectroscopy [11].The basic principle of pulsed EDENDOR is depicted in Fig. 1. For the 31 P donor in silicon to be investigated, its electron spin 31 P e with S = 1/2, its nuclear spin 31 P n with I = 1/2, and their hyperfine coupling give rise to a four-level system. For the electrical readout we use a spin-to-charge conversion mechanism based on a spin-dependent recombination involving the 31 P donor electron and the P b0 center (S = 1/2) at the Si/SiO 2 interface [8]. Accounting for the two orientations of the P b0 spin, we sketch the eight different states for the three involved spins in panel (i), indicating the occupation of the different states by the gray bars. Due to the Pauli principle, spin pairs with antiparallel spins recombine while the pairs w...