1996
DOI: 10.1049/el:19960300
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Mobility and saturation drift velocity enhancementin highlydoped GaAs and In x Ga 1– x As structures designed for use inpower FET devices

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Cited by 6 publications
(18 citation statements)
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“…Masselink [7] and Roberts et al [4] have found a clear correlation between µ and v sat for delta-doped quantum wells with different doping profiles. This correlation is very useful since it is essential to increase both quantities for satisfactory FET design.…”
Section: Introductionmentioning
confidence: 96%
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“…Masselink [7] and Roberts et al [4] have found a clear correlation between µ and v sat for delta-doped quantum wells with different doping profiles. This correlation is very useful since it is essential to increase both quantities for satisfactory FET design.…”
Section: Introductionmentioning
confidence: 96%
“…However, n channel is limited by the conduction band offset, making these devices less than optimal for the power applications described above. Masselink [2], Schubert and Ploog [3], Roberts et al [4] and Harris et al [5] have shown that delta-doping (where the dopants are confined to a single atomic plane) enables improvements in n channel without a large reduction in v sat . Thus a delta-doped quantum well may have advantages as the conducting channel of a power FET [6], the structure of which is sketched in figure 1.…”
Section: Introductionmentioning
confidence: 99%
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“…Current heterojunction FET designs are based either on the modulation-doped high electron mobility transistor (HEMT) approach, which has high mobility, but is limited in sheet carrier density [1], or the doped channel heterojunction field effect transistor (HFET) structure, which gives increased carrier density at the expense of degraded mobility [2]. We have recently reported [3] on a layer structure which combines the desirable features of these two approaches, and have demonstrated the possibility of obtaining high channel density structures (∼5 × 10 12 carriers cm −2 ) with mobility and saturation drift velocity values comparable with existing devices. This paper provides theoretical support for these observations and discusses the application of the structures to FET devices.…”
Section: Introductionmentioning
confidence: 99%