2015 1st Workshop on Nanotechnology in Instrumentation and Measurement (NANOFIM) 2015
DOI: 10.1109/nanofim.2015.8425350
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MOCVD growth and thermal analysis of Sb<inf>2</inf>Te<inf>3</inf> thin films and nanowires

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Cited by 5 publications
(8 citation statements)
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“…The chemical reactivity of SbCl 3 and Te(SiMe 3 ) 2 allowed exploiting the RT antimony telluride deposition, rather than a high-temperature pyrolysis-driven process; it is worth mentioning that the same set of precursors could be used in a hightemperature MOCVD: upon varying the temperature of the growth, within the 100−250 °C range, changes were induced on the granularity and overall morphology of the films (Figure S1, Supporting Information). 37 Nevertheless, the best quality was achieved via the RT MOCVD growth, followed by the substrate annealing and the post-growth annealing steps. Under the adopted RT experimental conditions, that consisted of SbCl 3 and Te(SiMe 3 ) 2 partial pressures set to 2.23 × 10 −4 and 3.25 × 10 −4 mbar, respectively, a total flow of 5.575 L min −1 , and a chamber pressure of 15 mbar, the process yielded, at a deposition time of 90 min, films in the thickness range from 29 to 35 nm, depending on the substrate of choice.…”
Section: ■ Results and Discussioncontrasting
confidence: 70%
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“…The chemical reactivity of SbCl 3 and Te(SiMe 3 ) 2 allowed exploiting the RT antimony telluride deposition, rather than a high-temperature pyrolysis-driven process; it is worth mentioning that the same set of precursors could be used in a hightemperature MOCVD: upon varying the temperature of the growth, within the 100−250 °C range, changes were induced on the granularity and overall morphology of the films (Figure S1, Supporting Information). 37 Nevertheless, the best quality was achieved via the RT MOCVD growth, followed by the substrate annealing and the post-growth annealing steps. Under the adopted RT experimental conditions, that consisted of SbCl 3 and Te(SiMe 3 ) 2 partial pressures set to 2.23 × 10 −4 and 3.25 × 10 −4 mbar, respectively, a total flow of 5.575 L min −1 , and a chamber pressure of 15 mbar, the process yielded, at a deposition time of 90 min, films in the thickness range from 29 to 35 nm, depending on the substrate of choice.…”
Section: ■ Results and Discussioncontrasting
confidence: 70%
“…S1 of supplementary material). [27] Nevertheless, the best quality was achieved via room temperature MOCVD growth implementing the substrates annealing and the post-growth annealing steps.…”
Section: Resultsmentioning
confidence: 99%
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“…Evidence and description of TI properties in such polycrystalline and granular systems is of dramatic importance, since it opens the way to the use of technologically‐appealing techniques for their fabrication . Among them, Metal Organic Chemical Vapor Deposition (MOCVD) can be efficiently exploited for the growth of chalcogenide conformal thin films and nanostructures on large areas . While the granularity‐controlled TI behavior of Bi 2 Te 3 films deposited by CVD has recently been described, there are no reports of similar studies on granular Sb 2 Te 3 films.…”
Section: Summary Of the Published α And Lϕ Values For Samples Of The ...mentioning
confidence: 99%