2002
DOI: 10.1049/el:20020217
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Modal refractive index of 1.3 lµm InGaAsP, AlGaInAs and GaInNAs semiconductor lasers under high hydrostatic pressure

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Cited by 4 publications
(3 citation statements)
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“…Furthermore, the measurements in [19] were preformed by spectroscopic ellipsometry of an unpumped surface layer, where as our measurements are performed on QWs electrically pumped close to threshold Jin et.al. have previously reported on the effective group index of InGaAsN lasers [20], obtaining a higher value of 3.65. It has been reported that refractive index increases with nitrogen content [19].…”
Section: Resultsmentioning
confidence: 91%
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“…Furthermore, the measurements in [19] were preformed by spectroscopic ellipsometry of an unpumped surface layer, where as our measurements are performed on QWs electrically pumped close to threshold Jin et.al. have previously reported on the effective group index of InGaAsN lasers [20], obtaining a higher value of 3.65. It has been reported that refractive index increases with nitrogen content [19].…”
Section: Resultsmentioning
confidence: 91%
“…It has been reported that refractive index increases with nitrogen content [19]. Therefore, the higher nitrogen content of 1.8% in the QW and the introduction of nitrogen into the barriers [21] could be the cause of the higher effective group index reported in [20].…”
Section: Resultsmentioning
confidence: 99%
“…The dominant effect of pressure and temperature on Γ occurs through the changes of λ; however, there is some small effect due to the refractive index contrast varying with pressure and temperature but it was shown to be negligible in Refs. [8] and [9]. In Refs.…”
Section: Tablementioning
confidence: 99%