2009
DOI: 10.1002/pssb.200945078
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Modification of biphenylselenolate monolayers by low‐energy electrons

Abstract: The effect of low‐energy (50 eV) electron irradiation on self‐assembled monolayers (SAMs) of aromatic selenolates on polycrystalline Au{111} was studied by synchrotron‐based X‐ray photoelectron spectroscopy and near‐edge X‐ray absorption fine structure spectroscopy. As a test system, SAMs of biphenylselenolate (BPSe) were used, and analogous biphenylthiolate (BPT) SAMs were taken as a reference. The BPSe films were found to exhibit the expected high stability of aromatic SAMs toward electron irradiation, prima… Show more

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Cited by 20 publications
(25 citation statements)
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“…Such a difference confirms the much higher efficiency of the cross-linking process in the case of BP n COO/Ag systems which effectively quenches desorption and thus thickness reduction upon electron irradiation. The same mechanism was also reported earlier for purely aromatic SAMs based on biphenyl thiols and selenols where even lower values of cross-section for thickness reduction were reported (∼2 × 10 –17 cm 2 ) . In fact, we expect that the efficiency of the cross-linking process for BP n COO/Ag compared to that for alkanethiols must be even higher considering very efficient elimination of the anchoring group in the case of BP n COO/Ag ( vide infra ) with at the same time very little efficiency of this process for SAMs based on thiols on the Ag or Au , substrate.…”
Section: Resultssupporting
confidence: 79%
See 1 more Smart Citation
“…Such a difference confirms the much higher efficiency of the cross-linking process in the case of BP n COO/Ag systems which effectively quenches desorption and thus thickness reduction upon electron irradiation. The same mechanism was also reported earlier for purely aromatic SAMs based on biphenyl thiols and selenols where even lower values of cross-section for thickness reduction were reported (∼2 × 10 –17 cm 2 ) . In fact, we expect that the efficiency of the cross-linking process for BP n COO/Ag compared to that for alkanethiols must be even higher considering very efficient elimination of the anchoring group in the case of BP n COO/Ag ( vide infra ) with at the same time very little efficiency of this process for SAMs based on thiols on the Ag or Au , substrate.…”
Section: Resultssupporting
confidence: 79%
“…The same mechanism was also reported earlier for purely aromatic SAMs based on biphenyl thiols and selenols where even lower values of cross-section for thickness reduction were reported (∼2 × 10 −17 cm 2 ). 54 In fact, we expect that the efficiency of the cross-linking process for BPnCOO/Ag compared to that for alkanethiols must be even higher considering very efficient elimination of the anchoring group in the case of BPnCOO/Ag (vide inf ra) with at the same time very little efficiency of this process for SAMs based on thiols on the Ag 25 or Au 8,55 substrate. As shown in Figure 1a, together with the intensity, the position, that is, the BE of the main component of C 1s, is modified upon electron irradiation.…”
Section: Resultsmentioning
confidence: 99%
“…For the former three SAMs, the thickness decreases by 25–30% at a dose of 4 mC/cm 2 . Such a relatively large reduction in thickness, which is significantly larger than that of thiol SAMs (≤ 10%) , and also reported for BP2-CA (∼28%), is related to the irradiation-induced processes at the SAM–substrate interface and points to the desorption of entire molecules before cross-linking in the SAM takes over. We note at this point that film thickness reflects the amount of material present.…”
Section: Resultssupporting
confidence: 56%
“…The relative increase of intensity of the 135 meV loss can be understood as resulting from increasing stretching contributions ascribed to simple C-C bonds. 56,61,62 Cross-linking was reported for aromatic SAMs under electron irradiation at 10 eV, 24,63 50 eV 8,25,27,28,30,64,65 and higher energies. 29,66 The mechanisms proposed involve primary and secondary electrons that are emitted from the SAM-substrate system, 67 which cause C-H bond breaking within the film.…”
Section: Resultsmentioning
confidence: 96%