1994
DOI: 10.1063/1.112384
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Molecular beam epitaxial growth of high quality InSb

Abstract: In this letter we report on the growth of high quality InSb by molecular beam epitaxy that has been optimized using reflection high energy electron diffraction. A 4.8 μm InSb layer grown on GaAs at a growth temperature of 395 °C and a III/V incorporation ratio of 1:1.2 had an x-ray rocking curve of 158 arcsec and a Hall mobility of 92 300 cm2 V−1 at 77 K. This is the best material quality obtained for InSb nucleated directly onto GaAs reported to date.

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Cited by 56 publications
(40 citation statements)
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“…Electron mobility near the interface, however, is low due to the scattering by the dislocations. This is because whole electron mobility has dependence of film thickness [14]. On the other hand, it is possible that carbon impurities derived from source materials act as carrier generators in the films.…”
Section: Resultsmentioning
confidence: 99%
“…Electron mobility near the interface, however, is low due to the scattering by the dislocations. This is because whole electron mobility has dependence of film thickness [14]. On the other hand, it is possible that carbon impurities derived from source materials act as carrier generators in the films.…”
Section: Resultsmentioning
confidence: 99%
“…For instance, a porous silicon intermediate sacrificial layer enables epitaxial growth and an easy removal of the epilayer from the substrate by selective etching which can be re-used several times for the deposition process [16]. Epitaxial growth techniques such as molecular beam epitaxy (MBE) [17], vapor phase epitaxy (VPE) [16] and liquid phase epitaxy (LPE) [16] have been proposed to grow silicon on porous silicon substrates.…”
Section: Introductionmentioning
confidence: 99%
“…The LPE is a mature, economic, safe and simple [15][16][17][18][19]. Moreover, LPE occurs close to thermodynamic equilibrium and therefore produces high quality epitaxial layer [15].…”
Section: Introductionmentioning
confidence: 99%
“…• C [19]. В настоящей работе изучались гетероструктуры, фор-мирующиеся в системе InSb/AlAs в двух режимах эпитаксии, значительно различающихся длиной поверх-ностной диффузии адатомов (L d ): режим поочередного осаждения материалов In и Sb, так называемый режим атомно-слоевой эпитаксии (АСЭ), и режим одновремен-ного осаждения материалов In и Sb, т. е. традицион-ный режим МЛЭ.…”
Section: Introductionunclassified