2000
DOI: 10.1063/1.481802
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Molecular modeling of electron trapping in polymer insulators

Abstract: Articles you may be interested inEffect of temperature on trap depth formation in multi-layer insulation: Low density polyethylene and fluorinated ethylene propylene Appl. Phys. Lett.From ab initio quantum chemistry to molecular dynamics: The delicate case of hydrogen bonding in ammonia

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Cited by 258 publications
(159 citation statements)
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“…This may serve as evidence that charge injection from the top has taken place. Polyethylene is a typical semi-crystalline material; it contains various charge traps [13]. Therefore, it is believed that the injected charge is captured by traps on its way towards the opposite electrode.…”
Section: Pea Resultsmentioning
confidence: 99%
“…This may serve as evidence that charge injection from the top has taken place. Polyethylene is a typical semi-crystalline material; it contains various charge traps [13]. Therefore, it is believed that the injected charge is captured by traps on its way towards the opposite electrode.…”
Section: Pea Resultsmentioning
confidence: 99%
“…One of the propositions for this mechanism is that, despite the affinities of different signs, both He and CH 4 impurities turns out to be effective traps in solid Ne, which scavenge electrons, thus not allowing them to escape into the vacuum. The observed effect is related to the processes of electron trapping in insulator materials [8,9]. The authors established a relationship between the electron trap and the molecular properties of the material.…”
Section: Resultsmentioning
confidence: 91%
“…It follows from examining of Eqs. (8) and (9) flows A(p) may increase reaching a maximum. Whether the gains in emission can be significant remains to be seen in experiments which are planned now.…”
Section: Resultsmentioning
confidence: 99%
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“…According to Quirke et al [16,17], the shallow traps have a very weak residence time of about 10 -12 s and the deep traps have an infinite residence time. For these reasons, we consider that the shallow traps are only integrated in transport mechanism and the deep traps contribute only to the charge accumulations.…”
Section: Hypothesis and Computational Proceduresmentioning
confidence: 99%