2014
DOI: 10.1007/s00339-014-8859-4
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Monitoring of amorfization of the oxygen implanted layers in silicon wafers using photothermal radiometry and modulated free carrier absorption methods

Abstract: This paper presents experimental results that characterize implanted layers in silicon being the result of a high energy implantation of O ?6 ions. We propose a simple relation between attenuation of photothermal radiometry and/ or modulated free carrier absorption amplitudes, the implanted layer thickness and its optical absorption coefficient. The thickness of the implanted layers was determined from capacitance-voltage characteristics and computations with the TRIM program. The obtained results allowed to e… Show more

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Cited by 17 publications
(11 citation statements)
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“…For Ar 8+ -ion-implanted silicon, spectral characteristics of the PTR signal appear in [6] and for O 6+ -ion-implanted silicon those can be found in [7]. The observed decrease in the plasma component of the PTR signal was interpreted as a result of not only a strong decrease in carrier lifetime in the implanted layer but also a strong increase in the optical absorption coefficient of the implanted layer.…”
Section: Introductionmentioning
confidence: 90%
See 1 more Smart Citation
“…For Ar 8+ -ion-implanted silicon, spectral characteristics of the PTR signal appear in [6] and for O 6+ -ion-implanted silicon those can be found in [7]. The observed decrease in the plasma component of the PTR signal was interpreted as a result of not only a strong decrease in carrier lifetime in the implanted layer but also a strong increase in the optical absorption coefficient of the implanted layer.…”
Section: Introductionmentioning
confidence: 90%
“…Results of investigations on the influence of Ar 8+ -and O 6+ -ion implantation in silicon on the PTR signal were presented in [5][6][7]. For Ar 8+ -ion-implanted silicon, spectral characteristics of the PTR signal appear in [6] and for O 6+ -ion-implanted silicon those can be found in [7].…”
Section: Introductionmentioning
confidence: 99%
“…The spectra have been measured with the same spectroscopic experimental set-up which has been described elsewhere [29,30]. The amorphization level of silicon can be measured with the Photo-thermal Radiometry or Modulated Free Carrier Absorption methods described elsewhere [31,32]. The optical Uoc voltage spectra of the solar cell are presented in Fig.…”
Section: Experimental Setup and Resultsmentioning
confidence: 99%
“…23,24 Intensity changes are correlated to the iron concentration bonded in the examined gel. 25 Presumably, the BDS technique would provide a highly sensitive chemical analysis, will be non-invasive and will retain optical and structural characteristics of the sample, thus, offering new possibilities for determination of iron species in natural water environments.…”
Section: Introductionmentioning
confidence: 99%