1991
DOI: 10.1103/physrevlett.67.3696
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Morphological instability in epitaxially strained dislocation-free solid films

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Cited by 431 publications
(286 citation statements)
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“…42 We anticipate substantial stain be retained in our film deposited at 350℃ since it was deposited at a lower temperature, which favors greater critical thickness. 43,44 In addition, strain is generally expected in films many times thicker than the critical thickness. 44,45 EuS films 200 monolayer thick exhibits strain induced lattice expansion and contraction.…”
Section: Resultsmentioning
confidence: 99%
“…42 We anticipate substantial stain be retained in our film deposited at 350℃ since it was deposited at a lower temperature, which favors greater critical thickness. 43,44 In addition, strain is generally expected in films many times thicker than the critical thickness. 44,45 EuS films 200 monolayer thick exhibits strain induced lattice expansion and contraction.…”
Section: Resultsmentioning
confidence: 99%
“…This destabilizing effect is the same as that in the classical stress-driven morphology instability. [6][7][8][9][10] The step line energy, which gives the term −1 in the coefficient of k 2 2 inside the brackets in the dispersion relation, and the force dipole interaction, which gives the terms containing ␣ 1 in the dispersion relation, are both stabilizing. The additional nonlinear terms due to the misfit force monopole interaction give the two terms containing ␣ 3 in the dispersion relation, which modify the instability.…”
Section: Linear Instabilitymentioning
confidence: 99%
“…[1][2][3][4] Many continuum models can be found in the literature on the surface morphological evolution under elastic effects, in which the surfaces are modeled as continuously changed profiles without any discrete structures on them. 2,[5][6][7][8][9][10][11][12][13][14][15][16] The stress in the solid is a destabilizing factor while the surface energy is a stabilizing one, and the planar surface of a stressed solid is unstable for perturbations with wave numbers less than a critical value. [6][7][8][9][10] These models work in the regime above the roughening transition temperature.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3][4][5][6][7][8][9][10][11][12][13][14] SAQDs are the result of a transition from 2D growth to 3D growth in strained epitaxial films such as Si x Ge 1Àx =Si and In x Ga 1Àx As/GaAs: This process is known as Stranski-Krastanow growth or VolmerWebber growth. 3,[15][16][17] In applications, order of SAQDs is a key factor. There are two types of order, spatial and size.…”
Section: Introductionmentioning
confidence: 99%