2007
DOI: 10.1016/j.surfcoat.2006.07.222
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Morphology and structure of polymer fluorocarbon coatings on polyimide by sputtering

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Cited by 13 publications
(13 citation statements)
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“…However, further increase of the FC coating thickness results in the increase of γs P /γs d , for example, γs P /γs d .= 1715 corresponding to the 113 nm FC layer. The increase of γs P /γs d .is probably caused by the imperfect stacking of the FC layer which can be evidenced by the AFM results ( Figure 3) [35]. The chemical compositions of FC coatings show significant dependence on the layer thickness, i.e., sputtering duration.…”
Section: Methodsmentioning
confidence: 81%
“…However, further increase of the FC coating thickness results in the increase of γs P /γs d , for example, γs P /γs d .= 1715 corresponding to the 113 nm FC layer. The increase of γs P /γs d .is probably caused by the imperfect stacking of the FC layer which can be evidenced by the AFM results ( Figure 3) [35]. The chemical compositions of FC coatings show significant dependence on the layer thickness, i.e., sputtering duration.…”
Section: Methodsmentioning
confidence: 81%
“…While it is not fully understood, similar film disparities have been documented on different polymer substrates. 5 Some explanation is necessary for the roughness observed on the third run. Higher deposition rates were observed for this deposition at the same power supply output and chamber pressure value of previous runs.…”
Section: Resultsmentioning
confidence: 98%
“…The trend of decreasing index between film 1 and films 2 and 3 is still present for the fits on both substrates. Others observed a trend of changing film structure from substrate to film surface in sputtered PTFE 5 . Table I gives the final thickness results and minimum mean squared error ͑MSE͒ found for each ellipsometry fit, as confirmed with AFM and profilometer measurements.…”
Section: Resultsmentioning
confidence: 99%
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“…The chemical compositions and structures of the deposited films were analyzed using XPS (VG ESCA LABS5 spectrometer), in which the monochromatic Al Ka radiation was used as the X-ray source. The XPS curves were studied using a conventional analytical procedure [19,20]. The samples' hydrophobicity before and after the sputtering was tested by a static contact angle measurement (JC2000A) with conventional water droplet method and by a water repellency tester (Y(B)813) with standard GB/T4745-1997.…”
Section: Characterizationmentioning
confidence: 99%