2004
DOI: 10.1080/09500830410001726996
|View full text |Cite
|
Sign up to set email alerts
|

Nanocomposite-like structure in an epitaxial CaCu3Ti4O12 film on LaAlO3 (001)

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
9
0

Year Published

2006
2006
2016
2016

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 13 publications
(9 citation statements)
references
References 12 publications
0
9
0
Order By: Relevance
“…Perovskite-like CaCu 3 Ti 4 O 12 (CCTO) with its ultra-high and stable dielectric constant over a broad frequency range from 0 Hz to 1 MHz in the temperature range of 100~600 K has been considered as a promising dielectric material candidate for various capacitance device applications56. The ultra-high dielectric constants of CCTO films are normally considered to be the results of the internal barrier layer capacitors (IBLC) consisting of semiconducting grains and insulating grain boundaries7891011. To further understand the nature of this material for practical device applications, it is necessary to systematically study the relationship between the physical properties and the atomic microstructures in high quality CCTO thin films with feasible ways to manipulate their physical properties.…”
mentioning
confidence: 99%
“…Perovskite-like CaCu 3 Ti 4 O 12 (CCTO) with its ultra-high and stable dielectric constant over a broad frequency range from 0 Hz to 1 MHz in the temperature range of 100~600 K has been considered as a promising dielectric material candidate for various capacitance device applications56. The ultra-high dielectric constants of CCTO films are normally considered to be the results of the internal barrier layer capacitors (IBLC) consisting of semiconducting grains and insulating grain boundaries7891011. To further understand the nature of this material for practical device applications, it is necessary to systematically study the relationship between the physical properties and the atomic microstructures in high quality CCTO thin films with feasible ways to manipulate their physical properties.…”
mentioning
confidence: 99%
“…The loss of the CCTO films might be caused from voids and/or second phase (interface between the two grains with different grain size). Jiang et al [8] also estimated that the grain boundary or domain boundary inside the CCTO films play a key role in their dielectric properties. More analyses of the effects of pore diameter, grain size, and film thickness on the dielectric properties are still under investigation.…”
Section: Electrical Propertiesmentioning
confidence: 98%
“…In order to apply CCTO in microelectronic devices and give a more fundamental understanding of its physical property, some groups have grown CCTO films by pulsed-laser deposition (PLD) with different substrates [8,9]. In the work of Jiang et al, high quality epitaxial CCTO films were prepared on a (001)-oriented LaAlO 3 substrate and presented a high dielectric constant of 10 4 at 1 MHz at room temperature [8].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Various efforts on the film/heterostructure fabrication and integration have been addressed in the past few years for their significant prospects in a wide range of applications. As a result of the extensive research in the area, a wide variety of oxide thin films and heterostructure such as ferromag- 166 and PbTiO 3 /SrTiO3 superlattices 167 have been successfully achieved.…”
Section: B New Techniques and Heterostructuresmentioning
confidence: 99%