Abstract. In this paper, a general method of producing zero-dimensional (0-D) and onedimensional (1-D) nano-structures by adjusting only one parameter in the process of production is investigated. To further study the result of small-scale effects, a quantitative characterization for the specific surface area of 1-D nanostructure is proposed. And the characterization method could be integrated into the nano-systems to reflect useful parameters for the analysis of nanomaterials. These two methods mentioned above could enhance nano-fabrication in volume productions, as well as predict the properties of nanodevices in years to come. This means, to some extent, would exert an unquestionably positive impact on manufacturing of nanomaterials and nanodevices.