1997
DOI: 10.1109/5.573744
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Nanofabrication with proximal probes

Abstract: In this paper, we describe the use of proximal probes, such as the atomic force microscope (AFM)

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Cited by 62 publications
(20 citation statements)
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“…However, such distortions limit the use of STMs in real-time visualization of surface processes, and limit the use of STMs in real-time surface modification applications such as nanofabrication [21]. Therefore, compensating for the dynamics is critical to precision positioning during operation of the STM.…”
Section: Solution To the Scanning Problemmentioning
confidence: 98%
“…However, such distortions limit the use of STMs in real-time visualization of surface processes, and limit the use of STMs in real-time surface modification applications such as nanofabrication [21]. Therefore, compensating for the dynamics is critical to precision positioning during operation of the STM.…”
Section: Solution To the Scanning Problemmentioning
confidence: 98%
“…Afterwards, the probe tip is scanned back and forth over the sample surface in the x-direction and slowly from top to bottom in the y-direction. The piezo-scanner positions the AFM-probe tip at a desired location for modifying or studying the sample surface; the probe tip can be used to create nanosized features by changing the interaction between the AFM-probe tip and sample surface [4,2,3] or for imaging a sample [25].…”
Section: The Experimental Afm Systemmentioning
confidence: 99%
“…For example, during AFM-based nanofabrication, piezos are used to position the AFM-probe tip at a desired location and then a surface feature is created by changing the interaction between the AFM-probe tip and sample surface [1][2][3]. One common technique for creating surface features is to apply a voltage between the probe tip and sample surface to induce local anodic oxidation, e.g., see [1]; the feature sizes achieved with this technique is smaller than 100 nm [4,5]. In such nanofabrication applications, it is not only necessary to achieve precision in the AFMprobe-tip position to create nanosized features, but it is also necessary to achieve precision positioning over relatively long ranges (tens of microns), e.g., to pattern interconnects between devices and electrical-contact pads [1,5].…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, these studies are important for lithography techniques in microelectronic device fabrication [8], exchange-bias junctions [9], aerospace technology [10,11], etc. Notably Ni 3 Al alloys have excellent resistance to oxidation because an adherent surface oxide ®lm is formed that protects the base metal from excessive attack [12].…”
mentioning
confidence: 99%