2008
DOI: 10.1063/1.2988526
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Nanometer-scale sharpness in corner-overgrown heterostructures

Abstract: A corner-overgrown GaAs/AlGaAs heterostructure is investigated with transmission and scanning transmission electron microscopy, demonstrating self-limiting growth of an extremely sharp corner profile of 3.5 nm width. In the AlGaAs layers we observe self-ordered diagonal stripes, precipitating exactly at the corner, which are regions of increased Al content measured by an XEDS analysis. A quantitative model for self-limited growth is adapted to the present case of faceted MBE growth, and the corner sharpness is… Show more

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Cited by 10 publications
(21 citation statements)
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“…We observe the formation of dark stripes at the nanowire corners, indicating Al enrichment. This accumulation is consistent with the difference in chemical potential and adatom mobility on (110) and (112)-type facets [17][18][19][20] . More intriguing is the morphology of some stripes at the end of the Al x Ga 1−x As layer (Fig.…”
supporting
confidence: 70%
“…We observe the formation of dark stripes at the nanowire corners, indicating Al enrichment. This accumulation is consistent with the difference in chemical potential and adatom mobility on (110) and (112)-type facets [17][18][19][20] . More intriguing is the morphology of some stripes at the end of the Al x Ga 1−x As layer (Fig.…”
supporting
confidence: 70%
“…The high-contrast stripe along the diagonal in Fig. 1(c) is an accumulation of Al adatoms, which occurs due to the slower diffusion of Al compared to Ga. 21,22 While previous high-resolution TEM measurements were restricted to a corner-overgrown test structure with AlAs/GaAs interfaces, 21 exploiting the increased contrast between AlAs and GaAs, the images presented here show for the first time that the GaAs/AlGaAs interfaces of corner-overgrown transport samples yield corner profiles with similar nanometer-scale sharpness.…”
Section: Tem and Corner Sharpness In The Transport Structurementioning
confidence: 99%
“…21 For example, the onedimensional accumulation wire in Fig. 3 is predicted to exist at B = 0 in the corner-overgrown heterostructures if the diameter of curvature at the corner 2r is smaller than half the Fermi wavelength λ F .…”
Section: Tem and Corner Sharpness In The Transport Structurementioning
confidence: 99%
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