2006
DOI: 10.1021/ma052727j
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Nanoscale Mechanical Characterization of Polymers by AFM Nanoindentations:  Critical Approach to the Elastic Characterization

Abstract: AFM nanoindentations show a dependence of penetration, i.e., the relative motion between the sample and the tip (indenter), on material elastic properties when using the same load. This relationship becomes visible by using of samples being homogeneous down to the scale of nanoindentation. They were prepared from materials covering a broad range of mechanical behavior: from rubbery networks to glassy and semicrystalline polymers. The elastic modulus can be obtained applying Sneddon's elastic contact mechanics … Show more

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Cited by 137 publications
(111 citation statements)
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“…The load-penetration depth curve can be used together with a contact mechanics model to calculate the stiffness of the sample. This technique has been successfully applied to both polymers and rubbers [26][27][28]. The viscoelastic properties of the samples can be obtained by performing measurements at various temperatures and/or indentation ratios [29,30].…”
Section: Nanoscale Mechanical Characterizationmentioning
confidence: 99%
“…The load-penetration depth curve can be used together with a contact mechanics model to calculate the stiffness of the sample. This technique has been successfully applied to both polymers and rubbers [26][27][28]. The viscoelastic properties of the samples can be obtained by performing measurements at various temperatures and/or indentation ratios [29,30].…”
Section: Nanoscale Mechanical Characterizationmentioning
confidence: 99%
“…The AFM-based HarmoniX Imaging has been introduced as a mechanical property mapping technique providing high resolution ([10 nm laterally) quantitative mechanical characterization of stiffness, elastic modulus, adhesion, and energy dissipation of a polymer surface [16][17][18][19].…”
Section: Introductionmentioning
confidence: 99%
“…The AFM-based nanoindentation has become an increasingly popular tool for characterizing polymer surfaces and thin films with widely different properties [16][17][18][19][20]. During operation of the AFM nanoindentation in force mode, the probe tip is first lowered into contact with the sample, then indented into the surface, and finally lifted off the sample surface.…”
Section: Characterizationmentioning
confidence: 99%