New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM

Abstract

Random Telegraph Noise (RTN) is one of the main reliability problems of resistive switching-based memories. To understand the physics behind RTN, a complete and accurate RTN characterization is required. The standard equipment used to analyse RTN has a typical time resolution of ~2ms which prevents evaluating fast phenomena.In this work, a new RTN measurement procedure, which increases the measurement time resolution to 2µs, is proposed. The experimental set-up, together with the recently proposed Weighted Time Lag (W-LT) method for the analysis of RTN signals, allows obtaining a more detailed and precise information about the RTN phenomenon.

Random Telegraph Noise in Metal‐Oxide Memristors for True Random Number Generators: A Materials Study

“…Different process recipes may result in different preferential segregation spots for the defects in the material stack, and the effect of local trapped charge contributes to distorting the local electrical potential as compared to the applied voltage, inhibiting any fair comparison of the sort. The only meaningful comparison was therefore based on the practical approach of exploring RTN in memristors to find (for each device) which were the stress and/or measurement conditions that produce the best overall quality of the RTN signal, [ 35 ] and quantify the current levels, the dispersion of the current in each level and σ C and σ E…”

Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller

“…I – t data series were processed via MATLAB scripts for the computation of current histograms, weighted time lag plots (w-TLP). 44,45 To perform low noise acquisitions of the RTN signals for the TRNG, a self-biased low noise TIA with a low noise bias source was implemented using off-the-shelf components, following the guidelines from the literature. 52 The simplified circuit schematic is shown in Fig.…”

“…, consecutive current values define y - and x -axes, respectively). This technique, called weighted time lag plot (w-TLP), has been often used as a characteristic figure-of-merit of RTN, 44,45 allowing to clearly discriminate current levels even in noisy signals. The result shows two clear groups of data points, one for each current level of the RTN signal, as shown in Fig.…”

Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors

“…This method is chosen because (i) there are only few defects per device on average, (ii) the signal-to-noise ratio is reasonably high, and (iii) the method requires little manual interaction. Other methods which could be used for this step include time-lag methods [21,22] or methods based on hidden Markov models [23,24].…”