2012
DOI: 10.3139/147.110141
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New Ways of Revealing the Microstructures of SiC Materials

Abstract: In order to understand the relationships which exist between the microstructures and mechanical properties of ceramic materials and to clarify their respective mechanisms of corrosion, a detailed picture of their microstructures is of particular importance. The examination of such structures using field emission scanning electron microscopy in combination with EDX analysis as well as the FIB technique are demonstrated on polished and electrochemically corroded LPS (liquid phase sintered SiC) and SSiC materials… Show more

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Cited by 6 publications
(6 citation statements)
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“…The contrast visible in the in-lens images indicates that the conductivity of the rim was typically higher than that of the core. The interpretation of the in-lens images of different SiC materials is given in detail in [14]. A few small SiC inclusions were also observed in the remaining silicon.…”
Section: Microstructurementioning
confidence: 96%
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“…The contrast visible in the in-lens images indicates that the conductivity of the rim was typically higher than that of the core. The interpretation of the in-lens images of different SiC materials is given in detail in [14]. A few small SiC inclusions were also observed in the remaining silicon.…”
Section: Microstructurementioning
confidence: 96%
“…For SiO 2 layers with relatively low electron densities the lowest thickness that could be detected is approximately 2-3 nm. Details are described elsewhere [14].…”
Section: Materials and Microstructural Analysismentioning
confidence: 99%
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