2011
DOI: 10.2478/s11772-010-0064-1
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Numerical analysis of absorption and transmission photoacoustic spectra of silicon samples with differently treated surfaces

Abstract: This paper presents results of the photoacoustic (PA) spectral studies, of a series of silicon samples with differently prepared surfaces, in two PA experimental configurations, so-called, absorption and transmission ones. The PA amplitude spectra of the samples indicated existence of the damaged surface layers. In the paper, the two layer mathematical models of a sample with a damaged surface layer that were used for numerical interpretation of the amplitude PA spectra of the investigated samples, are present… Show more

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Cited by 11 publications
(4 citation statements)
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“…The main interest of our investigations is semiconductors of the A2B6 group. In this case, the lifetimes of generated carriers are short in comparison to silicon and for low frequencies of modulation, the carriers phenomena do not play a role as important as in the case of silicon or germanium [16,17].…”
Section: Since It Is Very Sensitive and Is Complementary Tomentioning
confidence: 99%
“…The main interest of our investigations is semiconductors of the A2B6 group. In this case, the lifetimes of generated carriers are short in comparison to silicon and for low frequencies of modulation, the carriers phenomena do not play a role as important as in the case of silicon or germanium [16,17].…”
Section: Since It Is Very Sensitive and Is Complementary Tomentioning
confidence: 99%
“…The material's thermal properties (D s , k s ) were evaluated by the use of a least-squares fitting procedure of the experimental data [39,40] collected in the form of the amplitude and phase dependence on the modulation frequency (f ) of the pump beam. During the fitting, the thermal conductivity and diffusivity were given trial values to get the best fit [41,42]. The fitting procedure was then repeated taking into account the materials' thermal properties by the relation describing their dependence on material porosity [15], Equation 1:…”
Section: Sample Characterizationmentioning
confidence: 99%
“…Many papers describe PA spectra of thick semiconductor samples especially of mixed crystals [13,14]. PA spectroscopy is also used for investigations of differently treated surfaces of silicon samples [15].…”
Section: Introductionmentioning
confidence: 99%