2007
DOI: 10.1038/nphys781
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Observation of electron–hole puddles in graphene using a scanning single-electron transistor

Abstract: The electronic density of states of graphene is equivalent to that of relativistic electrons [1-3]. In the absence of disorder or external doping the Fermi energy lies at the Dirac point where the density of states vanishes. Although transport measurements at high carrier densities indicate rather high mobilities [4-6], many questions pertaining to disorder [7-14] remain unanswered. In particular, it has been argued theoretically, that when the average carrier density is zero, the inescapable presence of disor… Show more

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Cited by 1,472 publications
(1,527 citation statements)
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“…1,7 The background doping observed in our samples has been shown previously to be mainly caused by the FeCl etchant that is used to remove the copper foil from the as-grown CVD graphene, 7 although atmospheric impurities, and charge traps in the substrate can also play a role. 8,9 Interband transition measurements and E F fittings performed on bare graphene areas showed a similar gate vs. carrier density dependence to the patterned graphene areas, as was also observed in previous works. 7 We note that the carrier density we extract by monitoring the interband transitions is lower that what would be obtained from a simple parallel plate capacitance calculation for our device.…”
Section: Determination Of Carrier Density Of Graphene Sheetsupporting
confidence: 85%
“…1,7 The background doping observed in our samples has been shown previously to be mainly caused by the FeCl etchant that is used to remove the copper foil from the as-grown CVD graphene, 7 although atmospheric impurities, and charge traps in the substrate can also play a role. 8,9 Interband transition measurements and E F fittings performed on bare graphene areas showed a similar gate vs. carrier density dependence to the patterned graphene areas, as was also observed in previous works. 7 We note that the carrier density we extract by monitoring the interband transitions is lower that what would be obtained from a simple parallel plate capacitance calculation for our device.…”
Section: Determination Of Carrier Density Of Graphene Sheetsupporting
confidence: 85%
“…The charged impurities adsorbed on graphene or located at the interface between graphene and substrate induce Coulomb scattering [259], and are responsible for the electron-hole puddles at the neutrality point [260,261]. Both the resonant scattering [262] and Coulomb scattering significantly influence the drift mobility and electron mean free path, and therefore change the electrical properties of graphene [263].…”
Section: Disorders In Graphene Structurementioning
confidence: 99%
“…For example, the carrier mobility in graphene deposited on a substrate such as Si/SiO 2 deteriorates due to trapped charges in the oxide or to contaminants that get trapped at the graphene-substrate interface during fabrication. The substrate-induced charge inhomogeneity is particularly deleterious near the DP where screening is weak, 14,15 leading to reduced carrier mobility there. In addition, the atomic roughness of the substrate introduces short range scattering centers and may contribute to quench-condensation of ripples within the graphene layer 16 .…”
mentioning
confidence: 99%
“…The charge inhomogeneity introduces electron-hole puddles 14 close to the DP which cause spatial fluctuations in doping levels. These fluctuations define an energy bandwidth, , for the average deviation of local DP from the Fermi energy, .…”
mentioning
confidence: 99%