“…In our case we chose a field of view (FOV) between 250 and 300 nm. Other FOVs can be chosen just as easily and reproducible for the characterization of materials in nanotechnology for extracting quantitative information such as electrostatic fields (Ortolani et al, 2011; Zhang et al, 1992; McCartney et al, 1997, 2010), magnetic fields (Hirayama et al, 1995; Osakabe et al, 1983), non-stained biological samples (Simon et al, 2004, 2008), and impurities in solids, determination of the thickness and the lattice distortion in nanostructured materials and dopant profiles and strain measurement in semiconductor technology (Cooper et al, 2011; Muehle et al, 2005; Hytch et al, 2011). …”