1986
DOI: 10.1016/0022-3697(86)90062-4
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Octahedral vs tetrahedral coordination of the co(II) ion in layer compounds: CoxZn1−xIn2S4(O⩽x⩽0.46) solid solution

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Cited by 29 publications
(10 citation statements)
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“…The convoluted XPS spectra for S 2p peaks indicates the presence of FeS (161.55 eV) and CoS (162.73 eV). The reported values for FeS (161.6 ± 0.1 eV) [32] and for CoS (162.6 ± 0.2 eV) [33] are in agreement with binding energies obtained. The peak around 165 eV can be attributed to the presence of sulfur in the form of sulfate.…”
Section: Chemical Compositionsupporting
confidence: 90%
“…The convoluted XPS spectra for S 2p peaks indicates the presence of FeS (161.55 eV) and CoS (162.73 eV). The reported values for FeS (161.6 ± 0.1 eV) [32] and for CoS (162.6 ± 0.2 eV) [33] are in agreement with binding energies obtained. The peak around 165 eV can be attributed to the presence of sulfur in the form of sulfate.…”
Section: Chemical Compositionsupporting
confidence: 90%
“…The XPS peaks were assigned [24] using the references available on the online NIMS database for XPS spectra. The curve-fitted XPS spectra in Figure 2, identify the presence of GeS 2 [25] and In 2 S 3 [26] along with In 2 O 3 [27] on the surface. Thus, the surface layer of the chalcogenide glass structure consisted of sulfides [28] along with minor presence of In 2 O 3 .…”
Section: Resultsmentioning
confidence: 90%
“…For the ITO surface coated with BSA, the peak area decreases to 1.68% and the SiO 2 peak is not present in the spectra of the ITO surface coated with antibody-spiked BSA. In the 2p detailed scan for sulfur, the peak at 162.4 eV corresponds to the thiol bond to metals [43]. The peaks observed at 163.3 and 163.5 eV are assigned to thiol bonds that are not bound to metals.…”
Section: Xps Characterizationmentioning
confidence: 99%
“…In the 2p detailed scan for sulfur, the peak at 162.4 eV corresponds to the thiol bond to metals [43]. The peaks observed at 163.3 and 163.5 eV are assigned to thiol bonds that are not bound to metals.…”
Section: Xps Characterizationmentioning
confidence: 99%