On Generating Vectors That Invoke High Circuit Delays - Delay Testing and Dynamic Timing Analysis

Huang, I-De; Gupta, Sandeep

doi:10.1109/ats.2007.119

Cited by 5 publications

(1 citation statement)

References 15 publications

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“…Furthermore, we show in [13] that no deterministic approach exists to generate tests that guarantee the detection of these faults. Since functional sensitization is a weaker constraint than non-robust sensitization, one approach is to use the weaker functional sensitization constraints to generate multiple tests for each of these faults.…”

Section: Introductionmentioning

confidence: 99%

An Industrial Case Study of Sticky Path-Delay Faults

Huang

Chang

Gupta

et al. 2008

26th IEEE VLSI Test Symposium (Vts 2008)

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Sticky path-delay faults are path delay faults that are neither robustly nor non-robustly testable, but cannot be proven functionally unsensitizable. Better characterization of delay test quality requires a proper analysis of sticky path-delay faults. Furthermore, careful elimination of sticky path-delay faults contributes significantly to test development productivity and reduction of delay test cost.We present an industrial case study that shows the following. (a) On average, even after designers have removed false paths using automated tools and manual overrides, about 8% of path-delay faults with slack less than 10% of the clock period can be sticky. (b) Our approach, which extends a previously proposed technique, identifies a large subset of sticky path-delay faults that cannot cause functional failures and hence can be eliminated from further consideration. This significantly refines the delay test quality assessment and test development effort. (c) Our approach significantly reprioritizes (reorders) the remaining paths for test generation thereby improving the quality of the target path list.

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Section: Introductionmentioning

confidence: 99%