On-Orbit Error Rates of RHBD SRAMs: Comparison of Calculation Techniques and Space Environmental Models With Observed Performance

Bogorad, A.; Likar, Justin J.; Lombardi, Robert E.; Stone, Stephen E.; Herschitz, R.

doi:10.1109/tns.2011.2167242

Cited by 18 publications

(5 citation statements)

References 11 publications

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“…Despite we used the same LET spectra, our calculation scheme provides the unambiguous results that do not depend on the choice of the ill-defined model parameters. Notice that our SER predictions are rather close to on-orbit 1.8×10 -10 errors/bit/day, indicated in [24]. We have found that the use of logarithmic interpolation is a critical point since the neglect of the region C    leads to a strong underestimate in SER.…”

Section: Rhbd Sram On-orbit Data Analysissupporting

confidence: 77%

“…Approximation of the cross section data (adapted from [23]) with equation (7) Bogorad et al [24] provided the results of the SER calculations and some on-orbit SER data for the same SRAMs. In-flight data [24] 1.8×10 -10 errors/bit/day A comparison between the IRPP calculations [24] and our compact simulations with the parameters in Fig. 9 is presented in a Table V.…”

Section: Rhbd Sram On-orbit Data Analysismentioning

confidence: 99%

See 1 more Smart Citation

Compact Modeling and Simulation of Heavy Ion Induced Soft Error Rate in Space Environment: Principles and Validation

Зебрев

Galimov

2017

IEEE Trans. Nucl. Sci.

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-A simple physical model for calculation of the ioninduced soft error rate in space environment has been proposed, based on the phenomenological cross section notion. Proposed numerical procedure is adapted to the multiple cell upset characterization in highly scaled memories. Nonlocality of the ion impact has been revealed as the key concept determining the difference between physical processes in low scaled and highly scaled memories. The model has been validated by comparison between the simulation results and the literature on-board data. It was shown that proposed method provides single-valued prediction results correlating well with on-board data based solely on cross section data and LET spectra without any hidden fitting parameters and procedures.

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Section: Rhbd Sram On-orbit Data Analysissupporting

confidence: 77%

Section: Rhbd Sram On-orbit Data Analysismentioning

confidence: 99%

Compact Modeling and Simulation of Heavy Ion Induced Soft Error Rate in Space Environment: Principles and Validation

Зебрев

Galimov

2017

IEEE Trans. Nucl. Sci.

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“…For reference, [18] reports a worst case error rate of around 10 −16 errors/cycle for a space environment and [19] uses an injection rate of 10 −8 errors/cycle, assuming a clock frequency of 1GHz. Since the cycle overheads are negligible even for a 1 million cycle checkpoint interval (the overhead ratio there is 2.6 × 10 −7 on the Perror = 10 −12 line), the data shows that we can easily achieve the error removal limit of 99.83% with negligible performance cost.…”

Section: Resultsmentioning

confidence: 99%

High-level synthesis of error detecting cores through low-cost modulo-3 shadow datapaths

Campbell

Vissa

Pan

et al. 2015

Proceedings of the 52nd Annual Design Automation Conference

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In this study, we propose a low-cost approach to error detection for arithmetic orientated data paths by performing lightweight shadow computations in modulo-3 space for each main computation. By leveraging the binding and scheduling flexibility of high-level synthesis, we detect errors through diverse binding and minimize area cost through intelligent checkpoint scheduling and modulo-3 reducer sharing. We evaluated our technique with 12 high-level synthesis benchmarks using FPGA emulated netlist-level error injection. We observe coverages of 99.13% for stuck-at faults, 99.46% for soft errors, and 99.67% for timing errors with a 25.7% area cost and negligible performance impact. Leveraging error detection latencies on the order of 10 cycles (3 orders of magnitude faster than end result check) for soft errors, we also explore a rollback recovery method with an additional area cost of 28.0%, observing a 175x increase in reliability against soft errors.

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“…Indeed, any circuit C without feedback loop will return, after an SEU, to a correct state before K clock cycles, provided that K is larger than the maximal length of the simple paths in G C (paths without repeating vertices). In environments with high levels of ionizing radiations (e.g., space, particle accelerators), K is bigger than 10 10 [5]. So, even if our approach can deal with any K, we can assume that K is larger than the max length of all simple paths in G C .…”

Section: Syntactic Analysismentioning

confidence: 99%

Verification-guided voter minimization in triple-modular redundant circuits

Burlyaev

Fradet

Girault

2014

Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE), 2014

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We present a formal approach to minimize the number of voters in triple-modular redundant sequential circuits. Our technique actually works on a single copy of the circuit and considers a user-defined fault model (under the form "at most 1 bit-flip every k clock cycles"). Verification-based voter minimization guarantees that the resulting circuit (i) is fault tolerant to the soft-errors defined by the fault model and (ii) is functionally equivalent to the initial one. Our approach operates at the logic level and takes into account the input and output interface specifications of the circuit. Its implementation makes use of graph traversal algorithms, fixed-point iterations, and BDDs. Experimental results on the ITC'99 benchmark suite indicate that our method significantly decreases the number of inserted voters which entails a hardware reduction of up to 55% and a clock frequency increase of up to 35% compared to full TMR. We address scalability issues arising from formal verification with approximations and assess their efficiency and precision.

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On-Orbit Error Rates of RHBD SRAMs: Comparison of Calculation Techniques and Space Environmental Models With Observed Performance

Cited by 18 publications

References 11 publications

Compact Modeling and Simulation of Heavy Ion Induced Soft Error Rate in Space Environment: Principles and Validation

Compact Modeling and Simulation of Heavy Ion Induced Soft Error Rate in Space Environment: Principles and Validation

High-level synthesis of error detecting cores through low-cost modulo-3 shadow datapaths

Verification-guided voter minimization in triple-modular redundant circuits

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