On the Feasibility of Built-In Self Repair for Logic Circuits

Koal, Tobias; Scheit, Daniel; Scholzel, Mario; Vierhaus, Heinrich Theodor

doi:10.1109/dft.2011.52

Cited by 13 publications

(1 citation statement)

References 21 publications

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“…Only a diagnostic test of suitable resolution can clearly identify such faults as the first step of a repair procedure. Also therefore, built-in self repair by reconfiguration is typically a relative slow process, which needs time-slots in the area of milliseconds at best [10,11]. It can favorably be organized at start-up.…”

Section: Introductionmentioning

confidence: 98%

Combining fault tolerance and self repair at minimum cost in power and hardware

Koal

Scholzel

Vierhaus

2014

17th International Symposium on Design and Diagnostics of Electronic Circuits &Amp; Systems

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Large-scale integrated circuits and systems fabricated in nano-technologies exhibit new and enhanced fault properties which limit both their reliability and their life time. Transient fault effects have found most attention so far. They must be handled by on-line check and fault compensation based on duplication and triplication, typically at a significant amount of extra power. Such techniques are not suitable for life time extension, since their redundant elements all undergo wear-out effects in hot operation. Repair technologies that perform a process of system re-organization and introduction of cold redundancy may extend system life time, but they are too slow to catch and correct transient and permanent fault effects in hot operation. The essential task therefore remains to find methods and architectures that will provide on-line check in combination with self repair techniques at a minimum cost in extra power.

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Section: Introductionmentioning

confidence: 98%