The effect of charge carrier traps on emission-limited injected currents in narrow-band insulators is studied. At low voItages the physical mechanism responsible for the current is the trapping of injected carriers in the crystal image force potential we11 between the emitter and the potential maximum; the Schottky emission is the dominant conduction mechanism at high voltages. A theoretical model is presented and the voltage dependence of currents is derived including the effects of trapping and barrier lowering. It IS shown, in agreement with the model, that in injection experiments on anthracene and tetracene crystals the voltage ( U ) dependence of current (j) can be described by j mj,, exp (aUl/zb U -I P ) , where a and b are constants characterizing the crystals. The constant b depecdent on the trap concentration, determines a t what voltage the conductivity changes from trapping to Schottky barrier lowering mechanism. The hole diffusion length in five different anthracene and tetracene rrystals is found to be within the range 19 t o 310 A and the trap concentration in the vicinity of the injection contact, within the range 6 x x 1017 to 9 X lozo I / I C C J I e~O B a H H O BJIIIRIIHe JIOByUleK HOCIITeJIefi 3apHna H a 3~11CCIIOHHO-OrpaHII~IeHHL1,Ie IIH-il~eKUHOHIIbIe TOKII B Y3KO-30HHbIX II3OJlFITOpaX. B 06naCTII HLl3KHX IlaIIpHXeHHfi @II3Ll-9eCKIIM MeXaHH3MOM OTBeTCTBeHHbIM 38 TOR RBJIHeTCFI 3aXBaYLlBaHLle IIHmeKTHpOBaHmix Hocmenefi .repea JIOB~IIIKII, HaxonHUaecfi B o 6 n a c~~ KpbIcTanna, onpenenemoii RMOB ~~~K T~O C T~T I I~~C K O~O a e p~a n b a o r o noTeHr[nana a a~n~o s e~~o f i 3MMTePOM II MaH-CMMYMOM IlOTeHUIIaJla; B 06nac~m BbICOKLlX llarIpa~€!HII~ AOMIIHHPYIOUIIM MeXaHH3MOhf