The use of Hall effect and resistivity measurements is extremely common in the assessment of the quality of semiconductors. Control of the carrier concentration is needed to optimize the preparation conditions of material for a particular device, whereas the mobility is very often used as a simple figure of merit for the quality of the material. Moreover, if the temperature dependence of the carrier concentration and mobility is measured, many other material parameters of interest like, for instance, impurity concentrations and ionization energies can be deduced from the experimental data (ANDERSON, ASPLEY and references cited therein). It is obvious that the use of the mobility as quality parameter requires the knowledge of a reference mobility which represents the maximum mobility attainable a t a given carrier concentration. In principle, such reference curves for the mobility can be evaluated theoretically if all the material parameters required are known. However, in p-type conducting ATITBv compounds the theoretical calculations are confronted with considerable difficulties because of the complicated valence band structure and the lack of a consequent theoretical concept to describe the various scattering processes involved, in particular ionized impurity scattering ( I A~e , ~O K