2011
DOI: 10.1016/j.solmat.2010.12.053
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On the ultra-miniaturization of concentrator solar cells

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Cited by 15 publications
(12 citation statements)
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“…It is commonly assumed in the literature that the “lumped” series resistance value is “light-intensity” independent 6 . Previous research showed that the illumination level to which the cells are submitted should be taken into account when designing concentrator solar cells: in such case, the “lumped” series resistance value was shown to be strongly correlated to the illumination level and its value appears to decrease significantly with increasing sunlight concentration 3 .…”
Section: Methodsmentioning
confidence: 99%
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“…It is commonly assumed in the literature that the “lumped” series resistance value is “light-intensity” independent 6 . Previous research showed that the illumination level to which the cells are submitted should be taken into account when designing concentrator solar cells: in such case, the “lumped” series resistance value was shown to be strongly correlated to the illumination level and its value appears to decrease significantly with increasing sunlight concentration 3 .…”
Section: Methodsmentioning
confidence: 99%
“…In particular, appropriate tailoring of the front grid design should be realized toward finding the optimal balance between grid and contact resistance, emitter sheet resistance, and shading associated with the front-contact grid 4 , 5 . Decreasing the cell dimensions can also lead to decreased series resistance losses, through a drop in the area-related contribution of the series resistance 3 , 6 . However, these strategies only allow a moderate improvement in the cell efficiency and the peak illumination level for which the maximum efficiency is achieved does not exceed 1000 suns 7 9 .…”
Section: Introductionmentioning
confidence: 99%
“…5,6 We focus on polycrystalline thin film Cu(In,Ga)Se 2 (CIGS) microcells. CIGS is currently the most efficient thin film solar cell material, 7 and efficiencies over 20% were achieved recently.…”
mentioning
confidence: 99%
“…28 All the diode parameters used in the simulation are extracted from absolute electroluminescence (EL) calibration 29 and fitting with the experimental result. Values of the resistances are taken from the literature 30 and modified to fit both the dark IV and the transport efficiency.…”
Section: Methodsmentioning
confidence: 99%