“…The OR spectra of the sample grown on LEO-GaN exhibited distinct reflectance anomalies at 3.500 and 3.521 eV for the light polarization E perpendicular to the c-axis (E⊥c), and at 3.508 and 3.521 eV for E parallel to the c-axis (E//c), which are due to the excitonic transitions in the underlying GaN. The energy and polarization were different from those of A, B, and C transitions in strain-free GaN, reflecting the change in crystal symmetry from C 6v to C 2v due to the anisotropic strains [8,9]. The strains were quantified by X-ray diffraction measurements to be +0.10, +0.02, and -0.24 % along [11][12][13][14][15][16][17][18][19][20], , and [0001] directions, respectively, where minus and plus signs represent compressive and tensile, respectively.…”