1997
DOI: 10.1103/physrevb.56.12446
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Optical anisotropy of excitons in strained GaN epilayers grown along the 〈101¯0〉 direction

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Cited by 59 publications
(38 citation statements)
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“…In such a case, however, the c-axis is lying in the growth plane and although the splitting of the exciton states is still governed by the C 2v crystal symmetry the polarization dependence of the reflectance and PL spectra, which reflects the oscillator strength of different exciton states, is more complicated [34][35][36].…”
Section: Samples and Experimental Proceduresmentioning
confidence: 97%
“…In such a case, however, the c-axis is lying in the growth plane and although the splitting of the exciton states is still governed by the C 2v crystal symmetry the polarization dependence of the reflectance and PL spectra, which reflects the oscillator strength of different exciton states, is more complicated [34][35][36].…”
Section: Samples and Experimental Proceduresmentioning
confidence: 97%
“…The applicability of such a description has been demonstrated in measurements of the optical transition energies for GaN epilayers with residual strain. [23][24][25] To quantify the strain effects for InGaN or AlGaN alloys, accurate deformation potential parameters for all three nitrides are needed.…”
Section: 1214mentioning
confidence: 99%
“…Uncertainties in the results of the studies that use this approximation are thus to be expected. [25][26][27]40 Another complication is that the determination of the out-of-plane strain component depends on the numerical values of the elastic stiffness constants. The values of these constants also exhibit a lot of scatter.…”
mentioning
confidence: 99%
“…The OR spectra of the sample grown on LEO-GaN exhibited distinct reflectance anomalies at 3.500 and 3.521 eV for the light polarization E perpendicular to the c-axis (E⊥c), and at 3.508 and 3.521 eV for E parallel to the c-axis (E//c), which are due to the excitonic transitions in the underlying GaN. The energy and polarization were different from those of A, B, and C transitions in strain-free GaN, reflecting the change in crystal symmetry from C 6v to C 2v due to the anisotropic strains [8,9]. The strains were quantified by X-ray diffraction measurements to be +0.10, +0.02, and -0.24 % along [11][12][13][14][15][16][17][18][19][20], , and [0001] directions, respectively, where minus and plus signs represent compressive and tensile, respectively.…”
Section: Photon Energy (Ev)mentioning
confidence: 95%
“…In this article, improvements in the optical properties of (11-20) Al x Ga 1-x N/GaN multiple QWs (MQWs) are demonstrated by the use of GaN templates prepared by LEO (LEO-GaN) [7]. Polarized optical reflectance (OR) and photoluminescence (PL) spectra of LEO-GaN exhibited excitonic transitions, which obeyed the polarization selection rules for anisotropically-strained GaN [8,9]. Results of time-resolved PL (TRPL) measurements suggested that the improved η int of the MQWs on LEO-GaN was due to the increase in τ nr and the decrease in radiative lifetime (τ r ).…”
mentioning
confidence: 95%