2017
DOI: 10.1007/s12633-016-9548-z
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Optical, Electrical and Photoresponse Properties of Si-based Diodes with NiO-doped TiO2 Film Prepared by Sol-gel Method

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Cited by 19 publications
(5 citation statements)
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“…The n , Φ B , and R s values were reported between 14.96 and 21.96, 0.569 and 0.654 eV, and 0.34 and 6.7 kΩ (under dark condition), respectively. Tataroğlu et al [ 60 ] deposited nickel‐doped TiO 2 on n‐Si by a spin coating technique. They calculated n and Φ B values in the range of 3.2–2.2 and 0.81–0.86 eV, respectively.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The n , Φ B , and R s values were reported between 14.96 and 21.96, 0.569 and 0.654 eV, and 0.34 and 6.7 kΩ (under dark condition), respectively. Tataroğlu et al [ 60 ] deposited nickel‐doped TiO 2 on n‐Si by a spin coating technique. They calculated n and Φ B values in the range of 3.2–2.2 and 0.81–0.86 eV, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…This photocurrent value of 10% Li:TiO 2 /p‐Si diode at −5 V under 30 mW cm −2 is higher than the Al/TiO 2 /p‐Si structure with a value of ≈10 −5 A under 100 mW cm −2 , [ 63 ] the TiO 2 :ZnO/p‐Si structure with a value of ≈5 × 10 −5 A under 100 mW cm −2 [ 70 ] and lower than 5% coumarin:TiO 2 /p‐Si with a value of 1.33 × 10 −4 A, [ 61 ] and NiO:TiO 2 /n‐Si with a value of 5.25 × 10 −4 A. [ 60 ] Das et al [ 71 ] fabricated indium tin oxide (ITO)/TiO 2 /Al and ITO/reduced graphene oxide (rGO)–TiO 2 /Al Schottky diodes by the spin‐coating method. As a result of transient photocurrent measurements, they reported that the photosensitivity of the ITO/rGO–TiO 2 /Al increased by about 42% compared with the ITO/TiO 2 /Al diode.…”
Section: Resultsmentioning
confidence: 99%
“…Without any further process optimizations an ideality factor of η = 4.4 was determined for this diode structure (Figure S7, Supporting Information). Large ideality factor values > 2 were reported previously [60,61] and indicate, e.g., series resistance, interface interdiffusion, or a strained interface.…”
Section: Film Propertiesmentioning
confidence: 51%
“…Due to these properties, it finds use in many electrical and optoelectronic applications [9,10]. NiO is another promising p-type metal oxide semiconductor in electronic and optoelectronic devices due to its excellent optoelectronic properties, wide band gap (3.6-4.0 eV), low cost, high chemical and thermal stability [11][12][13][14]. The properties of photodiodes can be modified and improved by doping with a different element.…”
Section: Introductionmentioning
confidence: 99%