2018
DOI: 10.1126/sciadv.aao6050
|View full text |Cite
|
Sign up to set email alerts
|

Optical manipulation of work function contrasts on metal thin films

Abstract: Work function is a crucial metric in every optoelectronic device to ensure a specific charge transport scheme. However, the number of stable conductive materials available in a given work function range is scant, necessitating work function modulation. As opposed to all the previous chemical methods of work function modulation, we introduce here an alternative approach involving optical modulation. The work function is the minimum energy needed to eject an electron from a solid into vacuum and is known to be l… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
19
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
4
1

Relationship

1
4

Authors

Journals

citations
Cited by 41 publications
(20 citation statements)
references
References 36 publications
1
19
0
Order By: Relevance
“…The Cu/Si system produced an average surface potential shift of 256 mV and a maximum mode‐to‐mode shift in an individual measurement of 310 mV (Figure S3A, Supporting Information). To our knowledge, light‐induced surface potential shifts reported for metal thin films to date have not previously exceeded 220 mV …”
Section: Resultsmentioning
confidence: 78%
See 4 more Smart Citations
“…The Cu/Si system produced an average surface potential shift of 256 mV and a maximum mode‐to‐mode shift in an individual measurement of 310 mV (Figure S3A, Supporting Information). To our knowledge, light‐induced surface potential shifts reported for metal thin films to date have not previously exceeded 220 mV …”
Section: Resultsmentioning
confidence: 78%
“…[57] The present work used more abundant and lower cost transition metals, and achieved, in the case of Cu, a higher in-plane potential gradient. [57] The present work used more abundant and lower cost transition metals, and achieved, in the case of Cu, a higher in-plane potential gradient.…”
Section: Figurementioning
confidence: 86%
See 3 more Smart Citations