Optical properties of densified silica glasses

Tan, C.Z.; Arndt, Jörg; Xie, Hai

doi:10.1016/s0921-4526(98)00051-9

Cited by 46 publications

(28 citation statements)

References 20 publications

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“…In addition, since the refractive index of a glass is also related to its density, the lowering of the glass density induced by the introduction of ZnF 2 concentration will also contribute to the decrease in refractive index: this result is in good agreement with other similar studies performed on silica based glasses [12,13].…”

Section: Thermal Properties Density and Refractive Index Of The Glassessupporting

confidence: 90%

Preparation and characterization of new fluorotellurite glasses for photonics application

Liao

Chen

Jianjun

et al. 2009

Journal of Non-Crystalline Solids

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Section: Thermal Properties Density and Refractive Index Of The Glassessupporting

confidence: 90%

Preparation and characterization of new fluorotellurite glasses for photonics application

Liao

Chen

Jianjun

et al. 2009

Journal of Non-Crystalline Solids

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“…It should be noted that the exact process window for laser crystallization may vary upon the layer stack underneath the a-Si film, because the thermal diffusion is different [21]. A silicon heat sink layer can alleviate this problem [22].…”

Section: A Laser Treatment Of A-si Filmsmentioning

confidence: 99%

Low-Temperature Fabricated TFTs on Polysilicon Stripes

Brunets

Holleman

Kovalgin

et al. 2009

IEEE Trans. Electron Devices

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Abstract-This paper presents a novel approach to make highperformance CMOS at low temperatures. Fully functional devices are manufactured using back-end compatible substrate temperatures after the deposition of the amorphous-silicon starting material. The amorphous silicon is pretextured to control the location of grain boundaries. Green-laser annealing is employed for crystallization and dopant activation.

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“…Because the IR peak around 1120 cm À1 has been regarded as being related to the Si-O-Si bond angle [21][22][23], the density and the refractive index of the silica glass are correlated with the IR band position [24]. Spectra were measured using Fourier-transform infrared reflection microscopy (Multiscope FT-IR microscope; Perkin-Elmer Inc.) between 750 and 1400 cm À1 .…”

Section: Structural Relaxationmentioning

confidence: 99%