2006
DOI: 10.1063/1.2186372
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Optical property and Stokes’ shift of Zn1−xCdxO thin films depending on Cd content

Abstract: Effect of annealing on the spectral and nonlinear optical characteristics of thin films of nano-ZnO J. Appl. Phys.

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Cited by 60 publications
(26 citation statements)
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“…According to the rules of quantitative analysis of the XPS spectrum, the relative atomic surface concentrations can be determined using the integrated area of Cd3d , Zn2p, and O1s peaks, the Cd content can be evaluated approximately 13, 38, 91 at.% in the Zn 1-x Cd x O (x = 0.2, 0.5, 0.8) films, respectively. Therefore, it confirms the Cd incorporation into the ZnO and provides the composition of Cd as 13 at.% in our experiment without any second phase separation, which was significantly larger than the thermodynamic solid solubility limits (2 at.%)[34]. Moreover, it also confirms Zn incorporation into the CdO and provides the composition of Zn as 9 at.% in the Zn 1-x Cd x O (x = 0.8) film.The detailed microstructures of the Zn 1-x Cd x O (x = 0.2, 0.5, 0.8) films are characterized using high-resolution transmission electron microscope (HRTEM) in the present work.Fig.…”
supporting
confidence: 73%
“…According to the rules of quantitative analysis of the XPS spectrum, the relative atomic surface concentrations can be determined using the integrated area of Cd3d , Zn2p, and O1s peaks, the Cd content can be evaluated approximately 13, 38, 91 at.% in the Zn 1-x Cd x O (x = 0.2, 0.5, 0.8) films, respectively. Therefore, it confirms the Cd incorporation into the ZnO and provides the composition of Cd as 13 at.% in our experiment without any second phase separation, which was significantly larger than the thermodynamic solid solubility limits (2 at.%)[34]. Moreover, it also confirms Zn incorporation into the CdO and provides the composition of Zn as 9 at.% in the Zn 1-x Cd x O (x = 0.8) film.The detailed microstructures of the Zn 1-x Cd x O (x = 0.2, 0.5, 0.8) films are characterized using high-resolution transmission electron microscope (HRTEM) in the present work.Fig.…”
supporting
confidence: 73%
“…0.05. For the Cd x Zn 1Àx O films grown by Kang et al [15] with the same technique, the FWHM of Cd x Zn 1Àx O (002) rocking curve approached to 3.5 even the film contained only 3% Cd. The considerably enhanced out-of-plane atomic ordering of the quaternary CdZnOS films may result from bettercontrolled film deposition process.…”
Section: Resultsmentioning
confidence: 83%
“…The main reasons are as follows: (1) Cd and Zn ions have similar ionic radii of ∼0.74 and 0.60Å, respectively; (2) CdO has a direct band gap of ∼2.3 eV at room temperature, ∼1.0 eV narrower than that of ZnO [6,7]. In recent years, a variety of methods have been employed to deposit Cd x Zn 1−x O films, such as pulsed laser deposition [4,8], molecular beam epitaxy [9][10][11], metalorganic vapor-phase epitaxy [12,13], and magnetron sputtering [14]. Unfortunately, ZnO and CdO have different crystal structures as hexagonal and cubic, respectively.…”
Section: Introductionmentioning
confidence: 99%