“…According to the rules of quantitative analysis of the XPS spectrum, the relative atomic surface concentrations can be determined using the integrated area of Cd3d , Zn2p, and O1s peaks, the Cd content can be evaluated approximately 13, 38, 91 at.% in the Zn 1-x Cd x O (x = 0.2, 0.5, 0.8) films, respectively. Therefore, it confirms the Cd incorporation into the ZnO and provides the composition of Cd as 13 at.% in our experiment without any second phase separation, which was significantly larger than the thermodynamic solid solubility limits (2 at.%)[34]. Moreover, it also confirms Zn incorporation into the CdO and provides the composition of Zn as 9 at.% in the Zn 1-x Cd x O (x = 0.8) film.The detailed microstructures of the Zn 1-x Cd x O (x = 0.2, 0.5, 0.8) films are characterized using high-resolution transmission electron microscope (HRTEM) in the present work.Fig.…”