2020
DOI: 10.1016/j.joule.2020.06.004
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Overcoming Redox Reactions at Perovskite-Nickel Oxide Interfaces to Boost Voltages in Perovskite Solar Cells

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Cited by 382 publications
(462 citation statements)
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“…These conditions are similar to those that might be expected for encapsulated devices stored in ambient air. [ 59 ] In fact, the devices improved in performance after 5 months of storage in this environment, in which the PCE of Cs 3 Sb 2 Cl x I 9 ‐x more than doubled, increasing from 2.3% to 4.9% under FL illumination, and from 1.9% to 4.4% under WLED illumination. In the case of BiOI, the PCE increased from 2.4% to 4.0% under FL illumination, and remained stable at ≈3.4% under WLED illumination before and after 5 months of storage.…”
Section: Resultsmentioning
confidence: 99%
“…These conditions are similar to those that might be expected for encapsulated devices stored in ambient air. [ 59 ] In fact, the devices improved in performance after 5 months of storage in this environment, in which the PCE of Cs 3 Sb 2 Cl x I 9 ‐x more than doubled, increasing from 2.3% to 4.9% under FL illumination, and from 1.9% to 4.4% under WLED illumination. In the case of BiOI, the PCE increased from 2.4% to 4.0% under FL illumination, and remained stable at ≈3.4% under WLED illumination before and after 5 months of storage.…”
Section: Resultsmentioning
confidence: 99%
“…In HPs, these filaments are most likely formed by halogen vacancies. [ 32 ] Electrochemical reaction between NiO x and HP upon electrical bias, [ 33 ] and halide oxidation promoted by NiO x [ 34 ] might further increase halogen vacancies in the system and increase the probability of conductive filament formation. Upon sufficient negative bias application, the ions drift to the opposite direction rupturing the conductive filament and subsequently increase the device's resistance (RESET, Figure 1c).…”
Section: Resultsmentioning
confidence: 99%
“…This observation is in line with previous studies on NiO x /MAPbI 3 interface where Ni ≥3+ defect sites may act as both a Lewis acid that oxidizes X − anions and a Brønsted base that deprotonates the amine cations resulting in PbX 2 ‐rich perovskite domains at the interface. [ 34 ] The applied external bias during memristor measurements is expected to lower the oxidation potentials and reaction barriers further. The appearance of the PbBr 2 ‐rich domains upon bias application (Figure 2) testifies this further.…”
Section: Resultsmentioning
confidence: 99%
“…Peak 2 at ∼855 eV contains contributions from several possible Ni hydroxide species including α and ß-Ni(OH) 2 , and NiOOH with Ni in the 2 + and 3 + oxidation states (Mansour, 1994a;Mansour and Melendres, 1994;Biesinger et al, 2009). Peak 3 (∼856.5 eV) contains contributions from both the hydroxide species as well as NiO due to multiplet splitting of the primary NiO peak (Mansour, 1994b;Boyd et al, 2020). Peak 4 at highest binding energy (∼858 eV) is attributed to Ni in the 3 + and 4 + oxidation states (Grosvenor et al, 2006).…”
Section: Solar Cell Device Performancementioning
confidence: 99%