2012
DOI: 10.1016/j.jcrysgro.2011.12.055
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Overgrowth of GaN on GaN nanowires produced by mask-less etching

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Cited by 4 publications
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“…Wurtzite GaN NWs are usually grown 36 or etched vertically, 47 along the bulk crystalline c-axis, and can have triangular, hexagonal, or quasi-circular cross-sections, depending on the details of processing. [35][36][37][38][39] In silicon, simulation of electronic transport in rough cylindrical, square, and atomistically realistic nanowires yields results that are remarkably close to one another, both qualitatively and quantitatively, when these differently shaped wires have similar crosssectional feature size and similar edge roughness features; for instance, the electron mobility in a rough cylindrical wire of diameter equal to 8 nm 48 is very close to the mobility in a square NW with an 8-nm side.…”
Section: Electronic Transportmentioning
confidence: 99%
“…Wurtzite GaN NWs are usually grown 36 or etched vertically, 47 along the bulk crystalline c-axis, and can have triangular, hexagonal, or quasi-circular cross-sections, depending on the details of processing. [35][36][37][38][39] In silicon, simulation of electronic transport in rough cylindrical, square, and atomistically realistic nanowires yields results that are remarkably close to one another, both qualitatively and quantitatively, when these differently shaped wires have similar crosssectional feature size and similar edge roughness features; for instance, the electron mobility in a rough cylindrical wire of diameter equal to 8 nm 48 is very close to the mobility in a square NW with an 8-nm side.…”
Section: Electronic Transportmentioning
confidence: 99%