1998
DOI: 10.1109/3476.681391
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Oxidation and reduction kinetics of eutectic SnPb, InSn, and AuSn: a knowledge base for fluxless solder bonding applications

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Cited by 39 publications
(15 citation statements)
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“…The oxide film on the solder surface is expected to keep stable once formed since PBR of Sn is equal to 1.19 [4]. This can be verified by the results reported by Kuhmann et al [15] who investigated the oxidation kinetics of eutectic solder alloys. Fig.…”
Section: Effect Of Chemical Removal Process On the Characteristics Ofsupporting
confidence: 64%
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“…The oxide film on the solder surface is expected to keep stable once formed since PBR of Sn is equal to 1.19 [4]. This can be verified by the results reported by Kuhmann et al [15] who investigated the oxidation kinetics of eutectic solder alloys. Fig.…”
Section: Effect Of Chemical Removal Process On the Characteristics Ofsupporting
confidence: 64%
“…The AES profiles results indicate that the oxide thickness on the surface of the solder powders is significantly reduced by about 50%. In addition, according to the research reported by Kuhmann et al [15], the growth of the oxide depends on temperatures as well as on O 2 partial-pressures. Therefore, the oxide thinning process offers a possibility to control the oxide thickness, which is of great significance for the performance of solder pastes.…”
Section: Effect Of Chemical Removal Process On the Characteristics Ofmentioning
confidence: 89%
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“…A new bonding technique was also reported for a fluxless indium bonding process. [2][3][4] This study focuses on the fluxless solderability of pure indium solder for a chip bonding and fiber attach to chip carrier application. One advantage of pure indium solder is its low melting temperature (156°C).…”
Section: Introductionmentioning
confidence: 99%