Proceedings of 1998 Asia and South Pacific Design Automation Conference
DOI: 10.1109/aspdac.1998.669448
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Partial scan design methods based on internally balanced structure

Abstract: SUMMARYThe authors previously proposed an internally balanced-structure sequential circuit, being an extension of a balanced-structure sequential circuit, as a sequential circuit testable by the test generation algorithm for combinational circuits. In this paper, we propose a method of partial scan design based on such an internally balanced structure, and its test generation method. Moreover, we introduce a method of extended partial scan design, which provides transformation into easily testable sequential c… Show more

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Cited by 16 publications
(2 citation statements)
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“…Fujiwara et al [9], [10], [16], [17], [31] introduced another subclass of acyclic circuits called internally balanced (IB) circuits. In an IB circuit, all node-pairs, except those involving a primary input, are balanced.…”
Section: Circuit Subclasses and Atpg Methodsmentioning
confidence: 99%
“…Fujiwara et al [9], [10], [16], [17], [31] introduced another subclass of acyclic circuits called internally balanced (IB) circuits. In an IB circuit, all node-pairs, except those involving a primary input, are balanced.…”
Section: Circuit Subclasses and Atpg Methodsmentioning
confidence: 99%
“…This partial scan design method selects FFs to replace with scan FFs so that circuit structure has acyclic structure [8][9][10][11] in order to guarantee high fault efficiency. Moreover, the fault in an acyclic sequential circuit has the feature [2] that it is detectable with the number of ATPG patterns which is not more than sequential depth [2,6]+1 of the circuit.…”
Section: (2) the Basic Concept Of The Partial Scan Design Methodsmentioning
confidence: 99%