Zn1–x
Sn
x
O
y
(ZTO) deposited by
atomic layer
deposition has shown promising results as a buffer layer material
for kesterite Cu2ZnSnS4 (CZTS) thin film solar
cells. Increased performance was observed when a ZTO buffer layer
was used as compared to the traditional CdS buffer, and the performance
was further increased after an air annealing treatment of the absorber.
In this work, we study how CZTS absorber surface treatments may influence
the chemical and electronic properties at the ZTO/CZTS interface and
the reactions that may occur at the absorber surface prior to atomic
layer deposition of the buffer layer. For this, we have used a combination
of microscopy and synchrotron-based spectroscopies with variable information
depths (X-ray photoelectron spectroscopy, high-energy X-ray photoelectron
spectroscopy, and X-ray absorption spectroscopy), allowing for an
in-depth analysis of the CZTS near-surface regions and bulk material
properties. No significant ZTO buffer thickness variation is observed
for the differently treated CZTS absorbers, and no differences are
observed when comparing the bulk properties of the samples. However,
the formation of SnO
x
and compositional
changes observed toward the CZTS surface upon an air annealing treatment
may be linked to the modified buffer layer growth. Further, the results
indicate that the initial N2 annealing step integrated
in the buffer layer growth by atomic layer deposition, which removes
Na–CO
x
species from the CZTS surface,
may be useful for the ZTO/CZTS device performance.