2016
DOI: 10.1109/tem.2016.2580619
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Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery

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Cited by 40 publications
(9 citation statements)
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“…Rodriguez et al [5] proposed another approach that addresses TOD via patent outlierness, leveraging both patent attributes and citations. They proposed new outlier ranking methods developed specifically for patents in attributed patent citation networks.…”
Section: Bibliometricsmentioning
confidence: 99%
See 1 more Smart Citation
“…Rodriguez et al [5] proposed another approach that addresses TOD via patent outlierness, leveraging both patent attributes and citations. They proposed new outlier ranking methods developed specifically for patents in attributed patent citation networks.…”
Section: Bibliometricsmentioning
confidence: 99%
“…To overcome these difficulties, a variety of forecasting methods to identify promising industry, business, or technology areas have been developed thus far. Some of the more useful and widespread forecasting techniques are judgmental methods and bibliometric analysis methods [4][5][6][7]. Judgmental methods fundamentally rely on the opinions of experts or panels with knowledge in the fields that are relevant to the forecast.…”
Section: Introductionmentioning
confidence: 99%
“…Since patent information contains a variety of technology information, important properties of a technology field can be extracted by patent mining. Promising technology fields are identified [7], while the relationship between various technologies using a citation network is derived [8]. Technology trends are analyzed based on the number of registered patents each year [9, 10], while IPC code is used to find the core technology in an environmental ecology field [11].…”
Section: Theoretical Backgroundmentioning
confidence: 99%
“…Attempting to predict emerging technologies is a challenging task, because there are limited historical data on which to base such predictions [4]. Several forecasting methods have been proposed to overcome these difficulties, including judgmental approaches [5][6][7][8] and bibliometric analysis methods [9][10][11][12]. Existing methodologies effectively help to identify the most recent technological trends and discover hidden patterns in information on authors, inventors, affiliations, recent research, and patents [5].…”
Section: Introductionmentioning
confidence: 99%