2016
DOI: 10.1002/adfm.201602250
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Performance Limits of the Self‐Aligned Nanowire Top‐Gated MoS2 Transistors

Abstract: In order to realize the promising potential of MoS 2 as the alternative channel material, it is essential to achieve high-performance top-gated MoS 2 fieldeffect transistors (FETs), especially since the back-gated counterparts cannot control the device individually. Although uniform high-k dielectric films, such as HfO 2 , can be obtained through the introduction of artificial nucleation sites on the MoS 2 channel to fabricate top-gated FETs, this would inevitably degrade their channel/dielectric interface qua… Show more

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Cited by 43 publications
(25 citation statements)
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“…Designing new architectures or exploring new fabrication techniques to realize more precise and improved IR photodetection, have attracted many scientists . Son et al discovered a fabrication method to build integrated 3D electronic and optoelectronic 2DHs with graphene stops that consisted of graphene/fluorographene heterostructures (shown in Figure E).…”
Section: Two‐dimensional Heterostructuresmentioning
confidence: 99%
See 1 more Smart Citation
“…Designing new architectures or exploring new fabrication techniques to realize more precise and improved IR photodetection, have attracted many scientists . Son et al discovered a fabrication method to build integrated 3D electronic and optoelectronic 2DHs with graphene stops that consisted of graphene/fluorographene heterostructures (shown in Figure E).…”
Section: Two‐dimensional Heterostructuresmentioning
confidence: 99%
“…Designing new architectures or exploring new fabrication techniques to realize more precise and improved IR photodetection, have attracted many scientists. [89][90][91] Son et al 77 discovered a fabrication method to build integrated 3D F I G U R E 4 A, Electric field intensity-dependent band alignments and the Schottky barrier in the WSe 2 /grephene heterojunctions. Reproduced with permission.…”
Section: Device Structures and Physical Mechanism For Photodetectionmentioning
confidence: 99%
“…Fig. 2 demonstrates carrier mobilities versus current on/off ratio reported for field-effect transistors based on typical 2D materials including graphene [4,[19][20][21][22][23][24], TMDs [7,[25][26][27][28][29][30][31][32] and BP [8,25,[33][34][35][36][37][38][39]. As shown in Fig.…”
Section: Fundamental Propertiesmentioning
confidence: 99%
“…As shown in Figure a,b, the dark output characteristics (Ga 2 In 4 S 9 with 10 L) and the transfer characteristics (Ga 2 In 4 S 9 with different thicknesses) imply that the Ga 2 In 4 S 9 channel owns a representative n‐type semiconducting behavior with an on/off current ratio ≈10 7 . The carrier (electrons) mobility ( µ e ) is determined to be 1.3 cm 2 V −1 s −1 for 10 L Ga 2 In 4 S 9 based on the expressionμnormale=dIDSdVDS×LWVDSCnormaliwhere L is the channel length, W is the width, C i refers to the capacitance per unit area (≈11.6 nF cm −2 for the 300 nm SiO 2 layer). And the device mobility generally increases with the increasing number of layers (0.1 and 2.2 cm 2 V −1 s −1 for 6 and 20 L Ga 2 In 4 S 9 , respectively).…”
mentioning
confidence: 93%