2004
DOI: 10.1007/s11664-004-0118-6
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Phase field simulations of intermetallic compound growth during soldering reactions

Abstract: Phase field simulations of the microstructural evolution of the intermetallic compound (IMC) layer formed during isothermal soldering reactions between Sn-Cu solder alloys and a Cu substrate are presented. The simulation accounts for the fast grain boundary (GB) diffusion in the IMC layer, the concurrent IMC grain coarsening along with the IMC layer growth, and the dissolution of Cu from the substrate and IMC layer. The simulation results support the previous suggestions that the growth kinetics of the IMC lay… Show more

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Cited by 60 publications
(67 citation statements)
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“…Contrary to the early stages of morphological evolution, one can find that g grain growth in the late stages for case 1 and case 2 are similar to the results from previous works. 10,18,25 In the low-D GB scenario (case 2), the Cu substrate is not readily dissolved to form Cu 6 Sn 5 grains, so that the thickness of the IMC phase shows a lower rate of increase compared with case 1, which is in good agreement with previous work. 25 At the early stage (t < 0.1 s) during lead-free soldering in Fig.…”
Section: Resultssupporting
confidence: 90%
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“…Contrary to the early stages of morphological evolution, one can find that g grain growth in the late stages for case 1 and case 2 are similar to the results from previous works. 10,18,25 In the low-D GB scenario (case 2), the Cu substrate is not readily dissolved to form Cu 6 Sn 5 grains, so that the thickness of the IMC phase shows a lower rate of increase compared with case 1, which is in good agreement with previous work. 25 At the early stage (t < 0.1 s) during lead-free soldering in Fig.…”
Section: Resultssupporting
confidence: 90%
“…10,18,25 In the low-D GB scenario (case 2), the Cu substrate is not readily dissolved to form Cu 6 Sn 5 grains, so that the thickness of the IMC phase shows a lower rate of increase compared with case 1, which is in good agreement with previous work. 25 At the early stage (t < 0.1 s) during lead-free soldering in Fig. 4, the Cu substrate thickness remains unchanged, the thickness of the IMC increases gradually, and the number of IMC grains is not changed.…”
Section: Resultssupporting
confidence: 90%
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