2018
DOI: 10.7566/jpsj.87.061005
|View full text |Cite
|
Sign up to set email alerts
|

Photoelectron Diffraction and Holography Studies of 2D Materials and Interfaces

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
11
0

Year Published

2018
2018
2025
2025

Publication Types

Select...
9

Relationship

2
7

Authors

Journals

citations
Cited by 19 publications
(11 citation statements)
references
References 67 publications
0
11
0
Order By: Relevance
“…To obtain further insight into both surface terminations and their atomic structure, we used photoelectron diffraction, a method sensitive to the local structure around an atom of interest. , The corresponding Ge 3d and Te 4d diffraction patterns are shown in Figure . It should be emphasized that for a Te-terminated surface Ge atoms have three Te atoms above with shorter distance, whereas for a Ge-terminated surface Ge atoms (in the third layer) have three Te atoms above with longer distances.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…To obtain further insight into both surface terminations and their atomic structure, we used photoelectron diffraction, a method sensitive to the local structure around an atom of interest. , The corresponding Ge 3d and Te 4d diffraction patterns are shown in Figure . It should be emphasized that for a Te-terminated surface Ge atoms have three Te atoms above with shorter distance, whereas for a Ge-terminated surface Ge atoms (in the third layer) have three Te atoms above with longer distances.…”
Section: Resultsmentioning
confidence: 99%
“…To obtain further insight into both surface terminations and their atomic structure, we used photoelectron diffraction -a method sensitive to the local structure around an atom of interest. 43,44 The corresponding Ge 3d and Te 4d diffraction patterns are shown in Fig. 5.…”
Section: Surface Structure and Terminationmentioning
confidence: 99%
“…To gain a deep insight into the structure of the h-BN/Co(0001) interface we carried out PED measurements of the B 1s and N 1s core levels in angular mode. This technique was successfully applied to study the structure of 2D materials including h-BN monolayer [32,49]. To ensure high sensitivity of PED data to the position of the h-BN layer with respect to the substrate, we used a relatively low photoelectron kinetic energy of 300 eV, at which photoelectron backscattering has a notable contribution to the PED pattern.…”
Section: Resultsmentioning
confidence: 99%
“…In the X-ray range, the wavelength of the excited photoelectrons is of the order of the atomic distances in the solid. Hence, photoelectron diffraction (PED -also referred to as XPD in the Xray range) [9][10][11][12][13][14][15] influences the observed photoemission signals. This phenomenon is well understood for core-level photoemission, but thus far, data for PED in valence-band photoemission are sparse and results were interpreted analogously to core-level PED after integrating over a larger energy range [16][17][18].…”
Section: Introductionmentioning
confidence: 99%