1986
DOI: 10.1103/physrevlett.56.1408
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Photoemission-Based Photovoltage Probe of Semiconductor Surface and Interface Electronic Structure

Abstract: A saturation surface photovoltage is found to occur during ultraviolet photoemission at low temperatures ( r~ 20 K) on a variety of silicon (HI) surfaces. Below -50 K surface recombination becomes ineffective thereby allowing flat-band conditions to be achieved with mild uv irradiation. Temperature-dependent photoemission thereby provides a simple and direct method for determining band bending and barrier heights. Results for different silicon (111) surfaces and preparation conditions are discussed.

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Cited by 160 publications
(70 citation statements)
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“…A rigid shift of 0.45 eV toward a higher binding energy, which is observed after cooling the sample to 100 K, results from the surface photovoltage effect. 23 The spectra in Fig. 2 look different from those observed previously.…”
Section: B Si 2p Core Levelcontrasting
confidence: 52%
“…A rigid shift of 0.45 eV toward a higher binding energy, which is observed after cooling the sample to 100 K, results from the surface photovoltage effect. 23 The spectra in Fig. 2 look different from those observed previously.…”
Section: B Si 2p Core Levelcontrasting
confidence: 52%
“…The spatial distribution of the SPV-induced charge carriers in the band-bending potential opposes the original charge distribution that gave rise to the band bending. In this way, these photoinduced charges cancel the original electrostatic potential and thus lead to a decrease in the band bending [46][47][48][49][50][51]. Insight into the delicate synergy of SPV effects and photostimulated desorption of foreign species from the sample surface will be given in Sec.…”
Section: A Bi 2 Sementioning
confidence: 99%
“…12 For an n-type 100 ⍀ cm silicon crystal, the bulk Fermi level is approximately 0.75 eV above the valence-band maximum. 13 The band bending beneath the 7ϫ7 surface is thus only about 0.1 eV, and so the space charge layer region has a conductance close to that of the bulk.…”
Section: ͓S0003-6951͑00͒02749-2͔mentioning
confidence: 99%