Photon event evaluation for conventional pixelated detectors in energy-dispersive X-ray applications

Baumann, Jonas; Gnewkow, Richard; Staeck, Steffen; Szwedowski-Rammert, Veronika; Schlesiger, Christopher; Mantouvalou, Ioanna; Kanngießer, Birgit

doi:10.1039/c8ja00212f

Cited by 16 publications

(11 citation statements)

References 28 publications

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“…To detect the emitted x-rays, we exploit a charge-coupled device (CCD). The experimental setups are designed to allow a postprocessing, single-photon counting spectra reconstruction ( 26 , 27 ). Single-photon events can be clearly distinguished in Fig.…”

Section: Resultsmentioning

confidence: 99%

Integrated quantitative PIXE analysis and EDX spectroscopy using a laser-driven particle source

et al. 2021

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Among the existing elemental characterization techniques, particle-induced x-ray emission (PIXE) and energy-dispersive x-ray (EDX) spectroscopy are two of the most widely used in different scientific and technological fields. Here, we present the first quantitative laser-driven PIXE and laser-driven EDX experimental investigation performed at the Centro de Láseres Pulsados in Salamanca. Thanks to their potential for compactness and portability, laser-driven particle sources are very appealing for materials science applications, especially for materials analysis techniques. We demonstrate the possibility to exploit the x-ray signal produced by the co-irradiation with both electrons and protons to identify the elements in the sample. We show that, using the proton beam only, we can successfully obtain quantitative information about the sample structure through laser-driven PIXE analysis. These results pave the way toward the development of a compact and multifunctional apparatus for the elemental analysis of materials based on a laser-driven particle source.

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Section: Resultsmentioning

confidence: 99%

Integrated quantitative PIXE analysis and EDX spectroscopy using a laser-driven particle source

et al. 2021

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“…Then, the intensity of the photon signal, which is proportional to the photon energy, and which is usually smeared over several pixels due to charge splitting, can be recovered by software algorithms. [ 87–89 ] This approach provides real energy resolution and allows detection and discrimination of different XRF lines simultaneously, at least in the tender to hard X‐ray range. To date, the probably best‐suited detector for scanning‐free GEXRF with respect to pixel size (down to 36 μm), energy resolution (145 eV at Mn Kα) and frame rate (up to 1000 Hz) is the pnCCD, [ 90 ] which has been used in the investigation of a C‐Ni‐multilayer in the soft X‐ray range.…”

Section: Gexrf Instrumentationmentioning

confidence: 99%

Grazing Emission X‐Ray Fluorescence: Novel Concepts and Applications for Nano‐Analytics

Baumann

Kayser

Kanngießer

2020

Physica Status Solidi (b)

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Angle‐resolved X‐ray fluorescence spectroscopy gives access to elemental analysis of nanoscaled materials. The two main techniques of this method are grazing incidence X‐ray fluorescence (GIXRF) and grazing emission X‐ray fluorescence (GEXRF) spectroscopy. Principles of both techniques including main applications are discussed in this Review. The main focus lies on the description of GEXRF technique and its new analytical possibilities in the nano‐world.

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“…In order to analyze the intensities of the pixel clusters on the image recording the MCP irradiated using monoenergetic protons, as shown in the inset of Fig. 1, a numerical method was developed based on the work of Baumann et al 20 Since the number of scattered protons hitting the detector is on the order of a few tens to a few hundreds of protons per camera acquisition, the probability of having two protons hitting the same microchannel within this timeframe is sufficiently low (probability <5 × 10 −4 ) such that we can reasonably assume that the pixel clusters observed on the acquisition image are cones of light emitted by the phosphor from single proton events. The spatial resolution for this kind of MCP detection system is limited by the Point Spread Function (PSF) of phosphor, which generates cones of light spatially larger than the diameter of a microchannel (25 μm) and of the pixel size of the image acquisition system, which, using a lens magnification, relays a surface size on the MCP of 90 μm onto a single CCD pixel.…”

Section: Pixel Clustering Analysismentioning

confidence: 99%

Thomson parabola and time-of-flight detector cross-calibration methodology on the ALLS 100 TW laser-driven ion acceleration beamline

Vallières

Salvadori

Puyuelo-Valdes

et al. 2020

Review of Scientific Instruments

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We report on the cross-calibration of Thomson Parabola (TP) and Time-of-Flight (TOF) detectors as particle diagnostics, implemented on the most recent setup of the ALLS 100 TW laser-driven ion acceleration beamline. The Microchannel Plate (MCP) used for particle detection in the TP spectrometer has been calibrated in intensity on the tandem linear accelerator at the Université de Montréal. The experimental data points of the scaling factor were obtained by performing a pixel cluster analysis of single proton impacts on the MCP. A semi-empirical model was extrapolated and fitted to the data to apply the calibration also to higher kinetic energies and to extend it to other ion species. Two TOF lines using diamond detectors, placed at +6 ○ and −9 ○ with respect to the target-normal axis, were benchmarked against the TP spectrometer measurements to determine the field integrals related to its electric and magnetic dispersions. The mean integral proton numbers obtained on the beamline were about 4.1 × 10 11 protons/sr with a standard deviation of 15% in the central section of the spectrum around 3 MeV, hence witnessing the high repeatability of the proton bunch generation. The mean maximum energy was of 7.3 ± 0.5 MeV, well in agreement with similar other 100 TW-scale laser facilities, with the best shots reaching 9 MeV and nearly 10 12 protons/sr. The used particle diagnostics are compatible with the development of a high-repetition rate targetry due to their fast online readout and are therefore a crucial step in the automation of any beamline.

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Photon event evaluation for conventional pixelated detectors in energy-dispersive X-ray applications

Abstract: We analyze and compare 6 different approaches for evaluating energy and position of single X-ray photons detected with conventional pixelated detectors.

Cited by 16 publications

References 28 publications

Integrated quantitative PIXE analysis and EDX spectroscopy using a laser-driven particle source

Integrated quantitative PIXE analysis and EDX spectroscopy using a laser-driven particle source

Grazing Emission X‐Ray Fluorescence: Novel Concepts and Applications for Nano‐Analytics

Thomson parabola and time-of-flight detector cross-calibration methodology on the ALLS 100 TW laser-driven ion acceleration beamline

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